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Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto a variety of conductive scanning probes including atomic force microscope (AFM) tips and scanning tunnelling microscope (STM) needles using positive dielectrophoresis (DEP).…

材料科学 · 物理学 2011-06-21 Haoyan Wei , Anna Craig , Bryan D Huey , Fotios Papadimitrakopoulos , Harris Marcus

Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions. Applicability of SSPM and related electrostatic scanning probe microscopies for…

介观与纳米尺度物理 · 物理学 2009-11-07 Sergei V. Kalinin , Marcus Freitag , A. T. Johnson , Dawn A. Bonnell

We fabricate and characterize carbon-fiber tips for their use in combined scanning tunneling and force microscopy based on piezoelectric quartz tuning fork force sensors. An electrochemical fabrication procedure to etch the tips is used to…

In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded…

A scheme of the scanning rotational microscope is designed. This scheme is based on using carbon nanotubes simultaneously as a probe tip and as a bolt/nut pair which converts translational displacements of two piezo actuators into pure…

介观与纳米尺度物理 · 物理学 2015-06-04 Andrey M. Popov , Irina V. Lebedeva , Andrey A. Knizhnik

We examine the effect of van der Waals (vdW) interactions between atomic force microscope (AFM) tips and individual carbon nanotubes (CNTs) supported on SiO2. Molecular dynamics (MD) simulations reveal how CNTs deform during AFM…

介观与纳米尺度物理 · 物理学 2012-07-09 Rouholla Alizadegan , Albert D. Liao , Feng Xiong , Eric Pop , K. Jimmy Hsia

Precise control of particle positioning is desirable in many optical propulsion and sorting applications. Here, we develop an integrated platform for particle manipulation consisting of a combined optical nanofibre and optical tweezers…

Using a two-dipole model of an optical near-field of Scanning Near-field Optical Microscope tip, i. e. taking into account contributions of magnetic and electric dipoles, we propose and analyze a new type of 3D optical nanotrap found for…

光学 · 物理学 2009-11-11 V. V. Klimov , S. K. Sekatskii , G. Dietler

The controllable handling of an arbitrary single particle of matter with sub-100 nanometer (nm) dimensions is an essential but unsolved scientific challenge. We demonstrate nanoparticle-seeded glancing angle deposition using 10-100 nm…

We report on the nano-electron beam assisted fabrication of atomically sharp iron-based tips and on the creation of a nano-soldering iron for nano-interconnects using Fe-filled multiwalled carbon nanotubes (MWCNTs). High energy electron…

材料科学 · 物理学 2008-04-08 A. Misra , C. Daraio

We describe a new type of scanning probe microscope based on a superconducting quantum interference device (SQUID) that resides on the apex of a sharp tip. The SQUID-on-tip is glued to a quartz tuning fork which allows scanning at a…

Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high-field sensitivity with nanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes are now playing an…

介观与纳米尺度物理 · 物理学 2022-03-03 M. Wyss , K. Bagani , D. Jetter , E. Marchiori , A. Vervelaki , B. Gross , J. Ridderbos , S. Gliga , C. Schönenberger , M. Poggio

We demonstrate how optical nanofibers can be used to manipulate and probe single-atom fluorescence. We show that fluorescence photons from a very small number of atoms, average atom number of less than 0.1, around the nanofiber can readily…

量子物理 · 物理学 2007-05-23 K. P. Nayak , P. N. Melentiev , M. Morinaga , Fam Le Kien , V. I. Balykin , K. Hakuta

Recent advances in nanotechnologies have prompted the need for tools to accurately and non invasively manipulate individual nanoobjects. Among the possible strategies, optical forces have been widely used to enable nano optical tweezers…

We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip…

介观与纳米尺度物理 · 物理学 2009-11-10 Y. Yaish , J. -Y. Park , S. Rosenblatt , V. Sazonova , M. Brink , P. L. McEuen

Precise control of particle positioning is desirable in many optical propulsion and sorting applications. Here, we develop an integrated platform for particle manipulation consisting of a combined optical nanofiber and optical tweezers…

Recent advances in Nanotechnologies have prompted the need for tools to accurately and non-invasively manipulate individual nano-objects. Among possible strategies, optical forces have been foreseen to provide researchers with nano-optical…

光学 · 物理学 2014-03-10 J. Berthelot , S. S. Acimovic , M. L. Juan , M. P. Kreuzer , J. Renger , R. Quidant

We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called…

Motivated by the recent experiments by the Westervelt group using a mobile tip to probe the electronic state of quantum dots formed on a segmented nanowire, we study the shifts in Coulomb blockade peak positions as a function of the spatial…

介观与纳米尺度物理 · 物理学 2015-03-13 Jiang Qian , Bertrand I. Halperin , Eric J. Heller

The manipulation of geometrically constrained magnetic domain walls (DWs) in nanoscale magnetic strips has attracted much interest recently, with proposals for prospective memory and logic devices. Here we propose to use the high…

材料科学 · 物理学 2011-03-28 P. Vavassori , M. Gobbi , M. Donolato , V. Metlushko , B. Ilic , M. Cantoni , D. Petti , S. Brivio , R. Bertacco
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