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Silent data corruption (SDC) threatens the reliability of large-scale GPU clusters used for training large language models, yet its rarity and lack of explicit error signals make accurate high-level modeling challenging. To address this…

The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault…

硬件体系结构 · 计算机科学 2021-03-10 Ahmet Cagri Bagbaba , Maksim Jenihhin , Raimund Ubar , Christian Sauer

Silent Data Corruption (SDC) can have negative impact on large-scale infrastructure services. SDCs are not captured by error reporting mechanisms within a Central Processing Unit (CPU) and hence are not traceable at the hardware level.…

Silent Errors within hardware devices occur when an internal defect manifests in a part of the circuit which does not have check logic to detect the incorrect circuit operation. The results of such a defect can range from flipping a single…

硬件体系结构 · 计算机科学 2022-03-18 Harish Dattatraya Dixit , Laura Boyle , Gautham Vunnam , Sneha Pendharkar , Matt Beadon , Sriram Sankar

Machine learning-based software vulnerability detection requires high-quality datasets, which is essential for training effective models. To address challenges related to data label quality, diversity, and comprehensiveness, we constructed…

软件工程 · 计算机科学 2025-05-14 Chaomeng Lu , Tianyu Li , Toon Dehaene , Bert Lagaisse

Fault injection attacks represent a class of threats that can compromise embedded systems across multiple layers of abstraction, such as system software, instruction set architecture (ISA), microarchitecture, and physical implementation.…

密码学与安全 · 计算机科学 2025-05-07 Arsalan Ali Malik , Harshvadan Mihir , Aydin Aysu

The ever-increasing computational and storage requirements of modern applications and the slowdown of technology scaling pose major challenges to designing and implementing efficient computer architectures. To mitigate the bottlenecks of…

硬件体系结构 · 计算机科学 2025-01-10 Matteo Perotti , Samuel Riedel , Matheus Cavalcante , Luca Benini

Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can…

硬件体系结构 · 计算机科学 2024-05-21 Bing Xue , Mark Zwolinski

Whereas contemporary Error Correcting Codes (ECC) designs occupy a significant fraction of total die area in chip-multiprocessors (CMPs), approaches to deal with the vulnerability increase of CMP architecture against Single Event Upsets…

硬件体系结构 · 计算机科学 2016-07-29 Navid Khoshavi , Armin Samiei

As Large Language Models (LLMs) scale in size and complexity, the consequences of failures during training become increasingly severe. A major challenge arises from Silent Data Corruption (SDC): hardware-induced faults that bypass…

机器学习 · 计算机科学 2026-04-02 Anton Altenbernd , Philipp Wiesner , Odej Kao

Flaky failure triage is crucial for keeping distributed database continuous integration (CI) efficient and reliable. After a failure is observed, operators must quickly decide whether to auto-rerun the job as likely flaky or escalate it as…

软件工程 · 计算机科学 2026-03-25 Jun-Peng Zhu , Qizhi Wang , Yulong Zhai , Yishen Sun , Sen Chen , Kai Xu , Peng Cai , Hongming Zhang , Heng Long , Liu Tang , Qi Liu

The Instruction Set Architecture (ISA) defines processor operations and serves as the interface between hardware and software. As an open ISA, RISC-V lowers the barriers to processor design and encourages widespread adoption, but also…

密码学与安全 · 计算机科学 2026-01-21 Hao Lyu , Jingzheng Wu , Xiang Ling , Yicheng Zhong , Zhiyuan Li , Tianyue Luo

Spin-Transfer Torque Magnetic RAM (STT-MRAM) is known as the most promising replacement for SRAM technology in large Last-Level Caches (LLCs). Despite its high-density, non-volatility, near-zero leakage power, and immunity to radiation as…

硬件体系结构 · 计算机科学 2022-01-11 Elham Cheshmikhani , Hamed Farbeh , Hossein Asadi

Environmental noise (e.g.heat, ionized particles, etc.) causes transient faults in hardware, which lead to corruption of stored values. Mission-critical devices require such faults to be mitigated by fault-tolerance --- a combination of…

密码学与安全 · 计算机科学 2014-10-28 Filippo Del Tedesco , David Sands , Alejandro Russo

We present CrossCommitVuln-Bench, a curated benchmark of 15 real-world Python vulnerabilities (CVEs) in which the exploitable condition was introduced across multiple commits - each individually benign to per-commit static analysis - but…

密码学与安全 · 计算机科学 2026-04-24 Arunabh Majumdar

Cyber-physical system (CPS) forecasting models depend on sensor streams with noisy, biased, missing, or temporally misaligned readings, yet standard forecasting evaluation often selects models by nominal error without showing whether they…

机器学习 · 计算机科学 2026-05-12 Alexander Windmann , Philipp Wittenberg , Gianluca Manca , Marcel Dix , Jens U. Brandt , Oliver Niggemann

The clustering technique has attracted a lot of attention as a promising strategy for parallel debugging in multi-fault scenarios, this heuristic approach (i.e., failure indexing or fault isolation) enables developers to perform multiple…

软件工程 · 计算机科学 2022-07-20 Yi Song , Xiaoyuan Xie , Quanming Liu , Xihao Zhang , Xi Wu

Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…

硬件体系结构 · 计算机科学 2011-11-09 Celia Lopez-Ongil , Mario Garcia-Valderas , Marta Portela-Garcia , Luis Entrena-Arrontes

Post-Quantum Cryptographic (PQC) algorithms are mathematically secure and resistant to quantum attacks but can still leak sensitive information in hardware implementations due to natural faults or intentional fault injections. The intent…

密码学与安全 · 计算机科学 2025-08-06 Rourab Paul , Paresh Baidya , Krishnendu Guha

Single-event upset (SEU) fault tolerance for systems-on-chip (SoCs) in radiation-heavy environments is often addressed by architectural fault-tolerance approaches protecting individual SoC components (e.g., cores, memories) in isolation.…

硬件体系结构 · 计算机科学 2026-03-30 Michael Rogenmoser , Philippe Sauter , Chen Wu , Angelo Garofalo , Luca Benini
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