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The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous…

机器学习 · 计算机科学 2024-09-17 Ka Nam Canaan Law , Mingshuo Yu , Lianglei Zhang , Yiyi Zhang , Peng Xu , Jerry Gao , Jun Liu

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted…

计算机视觉与模式识别 · 计算机科学 2021-09-14 Yehonatan Fridman , Matan Rusanovsky , Gal Oren

Multimodal Large Language Models (MLLMs) show promise for general industrial quality inspection, but fall short in complex scenarios, such as Printed Circuit Board (PCB) inspection. PCB inspection poses unique challenges due to densely…

计算机视觉与模式识别 · 计算机科学 2026-01-28 Fuxiang Sun , Xi Jiang , Jiansheng Wu , Haigang Zhang , Feng Zheng , Jinfeng Yang

In modern electronic manufacturing, defect detection on Printed Circuit Boards (PCBs) plays a critical role in ensuring product yield and maintaining the reliability of downstream assembly processes. However, existing methods often suffer…

计算机视觉与模式识别 · 计算机科学 2025-07-08 Jiangzhong Cao , Huanqi Wu , Xu Zhang , Lianghong Tan , Huan Zhang

Real-world industrial inspection requires not only localizing defects, but also explaining them in natural language and generating controlled defect edits. However, existing approaches fail to jointly support all three capabilities within a…

计算机视觉与模式识别 · 计算机科学 2026-04-15 Haoyu Zheng , Tianwei Lin , Wei Wang , Zhuonan Wang , Wenqiao Zhang , Jiaqi Zhu , Feifei Shao

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the…

计算机视觉与模式识别 · 计算机科学 2024-09-24 Jiaqi Tang , Hao Lu , Xiaogang Xu , Ruizheng Wu , Sixing Hu , Tong Zhang , Tsz Wa Cheng , Ming Ge , Ying-Cong Chen , Fugee Tsung

Printed circuit boards (PCBs) are essential components of electronic devices, and ensuring their quality is crucial in their production. However, the vast variety of components and PCBs manufactured by different companies makes it…

计算机视觉与模式识别 · 计算机科学 2023-04-18 Faranak Shamsafar , Sunil Jaiswal , Benjamin Kelkel , Kireeti Bodduna , Klaus Illgner-Fehns

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this…

计算机视觉与模式识别 · 计算机科学 2026-01-15 Jackie Alex , Justin Petter

With the rapid growth of the PCB manufacturing industry, there is an increasing demand for computer vision inspection to detect defects during production. Improving the accuracy and generalization of PCB defect detection models remains a…

计算机视觉与模式识别 · 计算机科学 2024-07-23 Bowen Liu , Dongjie Chen , Xiao Qi

Printed Circuit Boards (PCBs) are critical components in modern electronics, which require stringent quality control to ensure proper functionality. However, the detection of defects in small-scale PCBs images poses significant challenges…

计算机视觉与模式识别 · 计算机科学 2025-06-17 Xiem HoangVan , Dang Bui Dinh , Thanh Nguyen Canh , Van-Truong Nguyen

This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution…

计算机视觉与模式识别 · 计算机科学 2026-04-28 Mohsen Asghari Ilani , Yaser Mike Banad

In the Industrial Internet of Things (IIoT), condition monitoring sensor signals from complex systems often exhibit nonlinear and stochastic spatial-temporal dynamics under varying conditions. These complex dynamics make fault detection…

机器学习 · 计算机科学 2024-08-22 Mengjie Zhao , Olga Fink

Recently, text-to-image generation models have achieved remarkable advancements, particularly with diffusion models facilitating high-quality image synthesis from textual descriptions. However, these models often struggle with achieving…

计算机视觉与模式识别 · 计算机科学 2024-12-30 Lunhao Duan , Shanshan Zhao , Wenjun Yan , Yinglun Li , Qing-Guo Chen , Zhao Xu , Weihua Luo , Kaifu Zhang , Mingming Gong , Gui-Song Xia

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

计算机视觉与模式识别 · 计算机科学 2023-07-04 Wenbo Sun , Raed Al Kontar , Judy Jin , Tzyy-Shuh Chang

With the proliferation of the Internet of Things (IoT) and the rising interconnectedness of devices, network security faces significant challenges, especially from anomalous activities. While traditional machine learning-based intrusion…

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…

计算机视觉与模式识别 · 计算机科学 2019-01-25 Weibo Huang , Peng Wei

Industrial anomaly detection based on RGB-3D multimodal data has emerged as a mainstream paradigm for intelligent quality inspection. However, existing unsupervised methods suffer from two critical limitations: ambiguous cross-modal…

计算机视觉与模式识别 · 计算机科学 2026-04-28 Zewen Li , Shuo Ye , Zitong Yu , Weicheng Xie , Linlin Shen

Ultrasonic metal welding (UMW) is widely used in industrial applications but is sensitive to tool wear, surface contamination, and material variability, which can lead to unexpected process faults and unsatisfactory weld quality.…

机器学习 · 计算机科学 2026-04-16 Ahmadreza Eslaminia , Kuan-Chieh Lu , Klara Nahrstedt , Chenhui Shao

With the rapid development of diffusion models in image generation, the demand for more powerful and flexible controllable frameworks is increasing. Although existing methods can guide generation beyond text prompts, the challenge of…

计算机视觉与模式识别 · 计算机科学 2025-07-09 Haoxuan Wang , Jinlong Peng , Qingdong He , Hao Yang , Ying Jin , Jiafu Wu , Xiaobin Hu , Yanjie Pan , Zhenye Gan , Mingmin Chi , Bo Peng , Yabiao Wang

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect…

计算机视觉与模式识别 · 计算机科学 2026-04-13 Yuanting Fan , Jun Liu , Bin-Bin Gao , Xiaochen Chen , Yuhuan Lin , Zhewei Dai , Jiawei Zhan , Chengjie Wang
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