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In industrial equipment monitoring, fault diagnosis is critical for ensuring system reliability and enabling predictive maintenance. However, the scarcity of fault data, due to the rarity of fault events and the high cost of data…

机器学习 · 计算机科学 2025-11-20 Yi Xu , Zhigang Chen , Rui Wang , Yangfan Li , Fengxiao Tang , Ming Zhao , Jiaqi Liu

Few-shot image classification aims to learn an image classifier using only a small set of labeled examples per class. A recent research direction for improving few-shot classifiers involves augmenting the labelled samples with synthetic…

计算机视觉与模式识别 · 计算机科学 2023-12-11 Victor G. Turrisi da Costa , Nicola Dall'Asen , Yiming Wang , Nicu Sebe , Elisa Ricci

Early-stage visual quality inspection is vital for achieving Zero-Defect Manufacturing and minimizing production waste in modern industrial environments. However, the complexity of robust visual inspection systems and their extensive data…

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this…

计算机视觉与模式识别 · 计算机科学 2026-01-15 Jackie Alex , Justin Petter

The performances of defect inspection have been severely hindered by insufficient defect images in industries, which can be alleviated by generating more samples as data augmentation. We propose the first defect image generation method in…

计算机视觉与模式识别 · 计算机科学 2023-03-07 Yuxuan Duan , Yan Hong , Li Niu , Liqing Zhang

Recent few-shot object detection (FSOD) methods have focused on augmenting synthetic samples for novel classes, show promising results to the rise of diffusion models. However, the diversity of such datasets is often limited in…

计算机视觉与模式识别 · 计算机科学 2025-02-26 Anh-Khoa Nguyen Vu , Quoc-Truong Truong , Vinh-Tiep Nguyen , Thanh Duc Ngo , Thanh-Toan Do , Tam V. Nguyen

Denoising diffusion probabilistic models (DDPMs) have been proven capable of synthesizing high-quality images with remarkable diversity when trained on large amounts of data. However, to our knowledge, few-shot image generation tasks have…

计算机视觉与模式识别 · 计算机科学 2023-03-08 Jingyuan Zhu , Huimin Ma , Jiansheng Chen , Jian Yuan

Few-shot image classification remains challenging due to the scarcity of labeled training examples. Augmenting them with synthetic data has emerged as a promising way to alleviate this issue, but models trained on synthetic samples often…

机器学习 · 计算机科学 2025-06-26 Lan-Cuong Nguyen , Quan Nguyen-Tri , Bang Tran Khanh , Dung D. Le , Long Tran-Thanh , Khoat Than

Machine learning, particularly deep learning, is transforming industrial quality inspection. Yet, training robust machine learning models typically requires large volumes of high-quality labeled data, which are expensive, time-consuming,…

计算机视觉与模式识别 · 计算机科学 2026-05-26 Ruo-Syuan Mei , Sixian Jia , Guangze Li , Soo Yeon Lee , Brian Musser , William Keller , Sreten Zakula , Jorge Arinez , Chenhui Shao

The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We…

计算机视觉与模式识别 · 计算机科学 2026-04-30 Paul Julius Kühn , Mika Pommeranz , Arjan Kuijper , Saptarshi Neil Sinha

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…

计算机视觉与模式识别 · 计算机科学 2025-07-09 Shuai Li , Shihan Chen , Wanru Geng , Zhaohua Xu , Xiaolu Liu , Can Dong , Zhen Tian , Changlin Chen

Industrial defect segmentation is critical for manufacturing quality control. Due to the scarcity of training defect samples, few-shot semantic segmentation (FSS) holds significant value in this field. However, existing studies mostly apply…

计算机视觉与模式识别 · 计算机科学 2025-02-12 Tongkun Liu , Bing Li , Xiao Jin , Yupeng Shi , Qiuying Li , Xiang Wei

Image generation can solve insufficient labeled data issues in defect detection. Most defect generation methods are only trained on a single product without considering the consistencies among multiple products, leading to poor quality and…

计算机视觉与模式识别 · 计算机科学 2024-08-02 Qingfeng Shi , Jing Wei , Fei Shen , Zhengtao Zhang

Domain adaptive object detection aims to leverage the knowledge learned from a labeled source domain to improve the performance on an unlabeled target domain. Prior works typically require the access to the source domain data for…

计算机视觉与模式识别 · 计算机科学 2023-06-08 Han Sun , Rui Gong , Konrad Schindler , Luc Van Gool

Few-shot image classification remains challenging due to the limited availability of labeled examples. Recent approaches have explored generating synthetic training data using text-to-image diffusion models, but often require extensive…

计算机视觉与模式识别 · 计算机科学 2025-09-29 Luc Boudier , Loris Manganelli , Eleftherios Tsonis , Nicolas Dufour , Vicky Kalogeiton

Few-shot object detection (FSOD) aims to expand an object detector for novel categories given only a few instances for training. The few training samples restrict the performance of FSOD model. Recent text-to-image generation models have…

计算机视觉与模式识别 · 计算机科学 2023-05-15 Shaobo Lin , Kun Wang , Xingyu Zeng , Rui Zhao

Few-shot semantic segmentation (FSS) has achieved great success on segmenting objects of novel classes, supported by only a few annotated samples. However, existing FSS methods often underperform in the presence of domain shifts, especially…

计算机视觉与模式识别 · 计算机科学 2024-04-17 Jiapeng Su , Qi Fan , Guangming Lu , Fanglin Chen , Wenjie Pei

Cross-Domain Few-Shot Segmentation aims to segment categories in data-scarce domains conditioned on a few exemplars. Typical methods first establish few-shot capability in a large-scale source domain and then adapt it to target domains.…

计算机视觉与模式识别 · 计算机科学 2026-02-06 Jiahao Nie , Guanqiao Fu , Wenbin An , Yap-Peng Tan , Alex C. Kot , Shijian Lu

Few-shot industrial anomaly detection (FS-IAD) presents a critical challenge for practical automated inspection systems operating in data-scarce environments. While existing approaches predominantly focus on deriving prototypes from limited…

计算机视觉与模式识别 · 计算机科学 2025-06-27 Long Tian , Yufei Li , Yuyang Dai , Wenchao Chen , Xiyang Liu , Bo Chen

Object detection has achieved substantial progress in the last decade. However, detecting novel classes with only few samples remains challenging, since deep learning under low data regime usually leads to a degraded feature space. Existing…

计算机视觉与模式识别 · 计算机科学 2022-06-07 Yuhang Cao , Jiaqi Wang , Ying Jin , Tong Wu , Kai Chen , Ziwei Liu , Dahua Lin
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