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Defect engineering has been profoundly employed to confer desirable functionality to materials that pristine lattices inherently lack. Although single atomic-resolution scanning transmission electron microscopy (STEM) images are widely…

Visual defect detection in industrial glass manufacturing remains a critical challenge due to the low frequency of defective products, leading to imbalanced datasets that limit the performance of deep learning models and computer vision…

计算机视觉与模式识别 · 计算机科学 2025-07-30 Sajjad Rezvani Boroujeni , Hossein Abedi , Tom Bush

Detecting subtle defects in window frames, including dents and scratches, is vital for upholding product integrity and sustaining a positive brand perception. Conventional machine vision systems often struggle to identify these defects in…

图像与视频处理 · 电气工程与系统科学 2023-09-14 Jorge Vasquez , Hemant K. Sharma , Tomotake Furuhata , Kenji Shimada

As the use of artificial intelligent (AI) models becomes more prevalent in industries such as engineering and manufacturing, it is essential that these models provide transparent reasoning behind their predictions. This paper proposes the…

计算机视觉与模式识别 · 计算机科学 2023-10-11 Jiajun Zhang , Georgina Cosma , Sarah Bugby , Axel Finke , Jason Watkins

In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…

图像与视频处理 · 电气工程与系统科学 2025-06-02 Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Jesse Davis

Integrated circuit manufacturing is highly complex, comprising hundreds of process steps. Defects can arise at any stage, causing yield loss and ultimately degrading product reliability. Supervised methods require extensive human annotation…

计算机视觉与模式识别 · 计算机科学 2025-11-06 Botong. Zhao , Xubin. Wang , Shujing. Lyu , Yue. Lu

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment…

计算机视觉与模式识别 · 计算机科学 2022-10-20 Nati Ofir , Ran Yacobi , Omer Granoviter , Boris Levant , Ore Shtalrid

Humans can easily detect a defect (anomaly) because it is different or salient when compared to the surface it resides on. Today, manual human visual inspection is still the norm because it is difficult to automate anomaly detection. Neural…

机器学习 · 计算机科学 2019-11-26 Manpreet Singh Minhas , John Zelek

Many successful methods developed for medical image analysis that are based on machine learning use supervised learning approaches, which often require large datasets annotated by experts to achieve high accuracy. However, medical data…

计算机视觉与模式识别 · 计算机科学 2022-07-25 Banafshe Felfeliyan , Abhilash Hareendranathan , Gregor Kuntze , David Cornell , Nils D. Forkert , Jacob L. Jaremko , Janet L. Ronsky

Data-driven fault detection has been regarded as a 3D image segmentation task. The models trained from synthetic data are difficult to generalize in some surveys. Recently, training 3D fault segmentation using sparse manual 2D slices is…

计算机视觉与模式识别 · 计算机科学 2024-10-28 Yimin Dou , Kewen Li , Jianbing Zhu , Timing Li , Shaoquan Tan , Zongchao Huang

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a…

计算机视觉与模式识别 · 计算机科学 2023-06-21 Haoping Bai , Shancong Mou , Tatiana Likhomanenko , Ramazan Gokberk Cinbis , Oncel Tuzel , Ping Huang , Jiulong Shan , Jianjun Shi , Meng Cao

Nuclei segmentation is a fundamental task in digital pathology analysis and can be automated by deep learning-based methods. However, the development of such an automated method requires a large amount of data with precisely annotated masks…

计算机视觉与模式识别 · 计算机科学 2021-11-25 Jiangbo Shi , Chang Jia , Zeyu Gao , Tieliang Gong , Chunbao Wang , Chen Li

Quantitative analysis of cell nuclei in microscopic images is an essential yet challenging source of biological and pathological information. The major challenge is accurate detection and segmentation of densely packed nuclei in images…

定量方法 · 定量生物学 2019-11-14 Linqing Feng , Jun Ho Song , Jiwon Kim , Soomin Jeong , Jin Sung Park , Jinhyun Kim

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method…

计算机视觉与模式识别 · 计算机科学 2023-06-08 MinJin Hwang , Bappaditya Dey , Enrique Dehaerne , Sandip Halder , Young-han Shin

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in…

计算机视觉与模式识别 · 计算机科学 2025-05-07 Haoyu Bai , Jie Wang , Gaomin Li , Xuan Li , Xiaohu Zhang , Xia Yang

Automatic defect detection is a challenging task because of the variability in texture and type of fabric defects. An effective defect detection system enables manufacturers to improve the quality of processes and products. Automation…

计算机视觉与模式识别 · 计算机科学 2021-01-19 Samit Chakraborty , Marguerite Moore , Lisa Parrillo-Chapman

Training of semantic segmentation models for material analysis requires micrographs and their corresponding masks. It is quite unlikely that perfect masks will be drawn, especially at the edges of objects, and sometimes the amount of data…

计算机视觉与模式识别 · 计算机科学 2024-08-02 Matias Oscar Volman Stern , Dominic Hohs , Andreas Jansche , Timo Bernthaler , Gerhard Schneider

Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data…

计算机视觉与模式识别 · 计算机科学 2024-10-25 Shancong Mou , Raviteja Vemulapalli , Shiyu Li , Yuxuan Liu , C Thomas , Meng Cao , Haoping Bai , Oncel Tuzel , Ping Huang , Jiulong Shan , Jianjun Shi

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…

人工智能 · 计算机科学 2026-04-22 Shuo Feng , Runlin Zhou , Yuyang Li , Guangcan Liu

The presence of gas pores in metal feedstock powder for additive manufacturing greatly affects the final AM product. Since current porosity analysis often involves lengthy X-ray computed tomography (XCT) scans with a full rotation around…

计算机视觉与模式识别 · 计算机科学 2024-08-06 Andreas Bjerregaard , David Schumacher , Jon Sporring