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The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…

应用物理 · 物理学 2025-11-25 Le Tri Dat , Nguyen Duy Vy

A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating…

介观与纳米尺度物理 · 物理学 2016-08-03 Aleksander Labuda , Marta Kocun , Tim Walsh , Jieh Meinhold , Tania Proksch , Waiman Meinhold , Martin Lysy , Roger Proksch

High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…

介观与纳米尺度物理 · 物理学 2014-03-11 C. Doolin , P. H. Kim , B. D. Hauer , A. J. R MacDonald , J. P Davis

Higher harmonic modes in nanoscale silicon cantilevers and microscale quartz tuning forks are detected and characterized using a custom scanning optical homodyne interferometer. Capable of both mass and force sensing, these resonators…

其他凝聚态物理 · 物理学 2008-03-16 Gabriel Zeltzer , Jason C. Randel , Amit K. Gupta , Rashid Bashir , Sang-Hun Song , Hari C. Manoharan

Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…

统计力学 · 物理学 2009-11-17 Pierdomenico Paolino , Bruno Tiribilli , Ludovic Bellon

In optical detection setups to measure the deflection of micro-cantilevers, part of the sensing light is absorbed, heating the mechanical probe. We present experimental evidences of a frequency shift of the resonant modes of a cantilever…

仪器与探测器 · 物理学 2015-06-23 Felipe Aguilar Sandoval , Mickael Geitner , Éric Bertin , Ludovic Bellon

The extensive research and development of micromechanical resonators is trying to allow the use of these devices for highly sensitive applications. Microcantilevers are some of the simplest MEMS structure and had been proved to be a good…

其他计算机科学 · 计算机科学 2008-02-22 M. Narducci , E. Figueras , I. Gracia , L. Fonseca , J. Santander , C. Cané

Non-invasive thermal noise calibration of both torsional and flexural eigenmodes is performed on numerous cantilevers of 10 different types. We show that for all tipless and short-tipped cantilevers, the ratio of torsional to flexural mode…

材料科学 · 物理学 2018-08-15 Per-Anders Thorén , Riccardo Borgani , Daniel Forchheimer , David B. Haviland

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…

仪器与探测器 · 物理学 2014-12-01 Stanislav S. Borysov , Daniel Forchheimer , David B. Haviland

Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations limit the determination of the resonance frequency of the…

介观与纳米尺度物理 · 物理学 2010-03-03 J. Colchero , M. Cuenca , J. F. Gonzalez Martinez , J. Abad , E. Palacios-Lidon , J. Abellan

In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…

介观与纳米尺度物理 · 物理学 2014-07-14 Sergio Santos , Victor Barcons

The nonlinear interactions between flexural and torsional modes of a microcantilever are experimentally studied. The coupling is demonstrated by measuring the frequency response of one mode, which is sensitive to the motion of another…

介观与纳米尺度物理 · 物理学 2012-07-17 H. J. R. Westra , H. S. J. van der Zant , W. J. Venstra

A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…

Aligning a microcantilever to an area of interest on a sample is a critical step in many scanning probe microscopy experiments, particularly those carried out on devices and rare, precious samples. We report a series of protocols that…

介观与纳米尺度物理 · 物理学 2018-01-10 Corinne E. Isaac , Elizabeth A. Curley , Pamela T. Nasr , Hoang L. Nguyen , John A. Marohn

Nowadays, silicon micro-cantilevers with different geometrical shapes are widely used as micro-electro-mechanical systems and, more recently, as force sensor probes in atomic force microscopy (AFM). During the last ten years, several…

经典物理 · 物理学 2009-04-28 Guy Louarn , Stéphane Cuenot

Nanoscale biosensors are devices designed to detect analytes by combining biological components and physicochemical detectors. One of the well known methods of constructing these sensors is by using nanocantilevers. These microscopic…

生物物理 · 物理学 2014-09-16 Patrick Snyder , Amitabh Joshi , Juan D. Serna

We demonstrate that the resonance frequencies of high-Q microcavities in two-dimensional photonic crystal membranes can be tuned over a wide range by introducing a subwavelength dielectric tip into the cavity mode. Three-dimensional…

其他凝聚态物理 · 物理学 2007-05-23 A. F. Koenderink , M. Kafesaki , B. C. Buchler , V. Sandoghdar

When heated, micro-resonators present a shift of their resonance frequencies. We study specifically silicon cantilevers heated locally by laser absorption, and evaluate theoretically and experimentally their temperature profile and its…

材料科学 · 物理学 2021-06-02 Basile Pottier , Felipe Aguilar , Mickaël Geitner , Francisco Melo , Ludovic Bellon

We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…

介观与纳米尺度物理 · 物理学 2011-12-12 K. C. Fong , P. Banerjee , Yu. Obukhov , D. V. Pelekhov , P. C. Hammel

We measure the mechanical thermal noise of soft silicon atomic force microscopy cantilevers. Using an interferometric setup, we have a resolution down to 1E-14 m/rtHz on a wide spectral range (3 Hz to 1E5 Hz). The low frequency behavior…

材料科学 · 物理学 2009-09-25 Pierdomenico Paolino , Ludovic Bellon
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