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Active Learning (AL) has garnered significant interest across various application domains where labeling training data is costly. AL provides a framework that helps practitioners query informative samples for annotation by oracles…

机器学习 · 计算机科学 2025-12-16 Pouya Ahadi , Blair Winograd , Camille Zaug , Karunesh Arora , Lijun Wang , Kamran Paynabar

Deploying Vision Transformers (ViTs) on near-sensor analog accelerators demands training pipelines that are explicitly aligned with device-level noise and energy constraints. We introduce a compact framework for silicon-photonic execution…

We initiate the study of active learning algorithms for classifying strategic agents. Active learning is a well-established framework in machine learning in which the learner selectively queries labels, often achieving substantially higher…

机器学习 · 计算机科学 2025-12-03 Maria-Florina Balcan , Hedyeh Beyhaghi

Supervised training of deep learning models requires large labeled datasets. There is a growing interest in obtaining such datasets for medical image analysis applications. However, the impact of label noise has not received sufficient…

计算机视觉与模式识别 · 计算机科学 2020-03-24 Davood Karimi , Haoran Dou , Simon K. Warfield , Ali Gholipour

Vision Transformers (ViTs) have demonstrated remarkable potential in image processing tasks by utilizing self-attention mechanisms to capture global relationships within data. However, their scalability is hindered by significant…

机器学习 · 计算机科学 2026-02-25 Huy Trinh , Rebecca Ma , Zeqi Yu , Tahsin Reza

Frozen Vision Foundation Models (VFMs) with lightweight classification heads are increasingly used in medical imaging because they offer efficient and reproducible deployment. Yet noisy-label learning methods for this frozen-feature regime…

计算机视觉与模式识别 · 计算机科学 2026-05-22 Zitong Li , Haoyu Wang

Learning with reduced labeling standards, such as noisy label, partial label, and multiple label candidates, which we generically refer to as \textit{imprecise} labels, is a commonplace challenge in machine learning tasks. Previous methods…

机器学习 · 计算机科学 2024-10-31 Hao Chen , Ankit Shah , Jindong Wang , Ran Tao , Yidong Wang , Xing Xie , Masashi Sugiyama , Rita Singh , Bhiksha Raj

Fine-grained classification is a challenging task that involves identifying subtle differences between objects within the same category. This task is particularly challenging in scenarios where data is scarce. Visual transformers (ViT) have…

计算机视觉与模式识别 · 计算机科学 2023-05-18 Manuel Lagunas , Brayan Impata , Victor Martinez , Virginia Fernandez , Christos Georgakis , Sofia Braun , Felipe Bertrand

A variety of modern applications exhibit multi-view multi-label learning, where each sample has multi-view features, and multiple labels are correlated via common views. Current methods usually fail to directly deal with the setting where…

机器学习 · 计算机科学 2023-08-30 Zhiwei Li , Zijian Yang , Lu Sun , Mineichi Kudo , Kego Kimura

Although numerous methods to reduce the overfitting of convolutional neural networks (CNNs) exist, it is still not clear how to confidently measure the degree of overfitting. A metric reflecting the overfitting level might be, however,…

机器学习 · 计算机科学 2022-09-28 Svetlana Pavlitskaya , Joël Oswald , J. Marius Zöllner

The major driving force behind the immense success of deep learning models is the availability of large datasets along with their clean labels. Unfortunately, this is very difficult to obtain, which has motivated research on the training of…

计算机视觉与模式识别 · 计算机科学 2020-01-03 Devraj Mandal , Shrisha Bharadwaj , Soma Biswas

Studies on benign overfitting provide insights for the success of overparameterized deep learning models. In this work, we examine whether overfitting is truly benign in real-world classification tasks. We start with the observation that a…

机器学习 · 计算机科学 2023-04-04 Kaiyue Wen , Jiaye Teng , Jingzhao Zhang

Vision transformers (ViTs) achieve remarkable performance on large datasets, but tend to perform worse than convolutional neural networks (CNNs) when trained from scratch on smaller datasets, possibly due to a lack of local inductive bias…

计算机视觉与模式识别 · 计算机科学 2023-05-16 Ibrahim Batuhan Akkaya , Senthilkumar S. Kathiresan , Elahe Arani , Bahram Zonooz

Because large, human-annotated datasets suffer from labeling errors, it is crucial to be able to train deep neural networks in the presence of label noise. While training image classification models with label noise have received much…

机器学习 · 计算机科学 2019-03-19 Ishan Jindal , Daniel Pressel , Brian Lester , Matthew Nokleby

Recently, the mysterious In-Context Learning (ICL) ability exhibited by Transformer architectures, especially in large language models (LLMs), has sparked significant research interest. However, the resilience of Transformers' in-context…

计算与语言 · 计算机科学 2024-05-02 Chen Cheng , Xinzhi Yu , Haodong Wen , Jingsong Sun , Guanzhang Yue , Yihao Zhang , Zeming Wei

We study model-agnostic post-hoc calibration methods intended to improve probabilistic predictions in supervised binary classification on real i.i.d. tabular data, with particular emphasis on conformal and Venn-based approaches that provide…

机器学习 · 计算机科学 2026-01-29 Valery Manokhin , Daniel Grønhaug

There is an emerging trend to leverage noisy image datasets in many visual recognition tasks. However, the label noise among the datasets severely degenerates the \mbox{performance of deep} learning approaches. Recently, one mainstream is…

计算机视觉与模式识别 · 计算机科学 2017-11-03 Jiangchao Yao , Jiajie Wang , Ivor Tsang , Ya Zhang , Jun Sun , Chengqi Zhang , Rui Zhang

Imperfections in data annotation, known as label noise, are detrimental to the training of machine learning models and have an often-overlooked confounding effect on the assessment of model performance. Nevertheless, employing experts to…

Understanding the impact of data set design on model training and performance can help alleviate the costs associated with generating remote sensing and overhead labeled data. This work examined the impact of training shifted window…

计算机视觉与模式识别 · 计算机科学 2023-10-12 Ryan Ford , Kenneth Hutchison , Nicholas Felts , Benjamin Cheng , Jesse Lew , Kyle Jackson

Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and recognition of the multiple overlapping defect types in…

计算机视觉与模式识别 · 计算机科学 2025-04-04 Faisal Mohammad , Duksan Ryu