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Quality control is an essential process in manufacturing to make the product defect-free as well as to meet customer needs. The automation of this process is important to maintain high quality along with the high manufacturing throughput.…

计算机视觉与模式识别 · 计算机科学 2020-07-03 Aditya M. Deshpande , Ali A. Minai , Manish Kumar

Automatic defect recognition is one of the research hotspots in steel production, but most of the current methods mainly extract features manually and use machine learning classifiers to recognize defects, which cannot tackle the situation,…

计算机视觉与模式识别 · 计算机科学 2019-09-18 Jingwen Fu , Xiaoyan Zhu , Yingbin Li

Recently, outstanding identification rates in image classification tasks were achieved by convolutional neural networks (CNNs). to use such skills, selective CNNs trained on a dataset of well-known images of metal surface defects captured…

计算机视觉与模式识别 · 计算机科学 2024-06-24 Nadeem Jabbar Chaudhry , M. Bilal Khan , M. Javaid Iqbal , Siddiqui Muhammad Yasir

Unsupervised machine learning offers significant opportunities for extracting knowledge from unlabeled data sets and for achieving maximum machine learning performance. This paper demonstrates how to construct, use, and evaluate a high…

材料科学 · 物理学 2021-04-13 Ryan Cohn , Elizabeth Holm

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

图像与视频处理 · 电气工程与系统科学 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low…

机器学习 · 计算机科学 2025-04-25 Cheng Shen , Yuewei Liu

Automatic identification of screw types is important for industrial automation, robotics, and inventory management. However, publicly available datasets for screw classification are scarce, particularly for controlled single-object…

计算机视觉与模式识别 · 计算机科学 2026-03-16 Tianhao Fu , Bingxuan Yang , Juncheng Guo , Shrena Sribalan , Yucheng Chen

Metal manufacturing often results in the production of defective products, leading to operational challenges. Since traditional manual inspection is time-consuming and resource-intensive, automatic solutions are needed. The study utilizes…

计算机视觉与模式识别 · 计算机科学 2024-10-08 Toqa Alaa , Mostafa Kotb , Arwa Zakaria , Mariam Diab , Walid Gomaa

Automotive manufacturing assembly tasks are built upon visual inspections such as scratch identification on machined surfaces, part identification and selection, etc, which guarantee product and process quality. These tasks can be related…

计算机视觉与模式识别 · 计算机科学 2020-07-07 Muriel Mazzetto , Marcelo Teixeira , Érick Oliveira Rodrigues , Dalcimar Casanova

The Intermeshed Steel Connection (ISC) system, when paired with robotic manipulators, can accelerate steel-frame assembly and improve worker safety by eliminating manual assembly. Dependable perception is one of the initial stages for…

计算机视觉与模式识别 · 计算机科学 2025-11-06 Miftahur Rahman , Samuel Adebayo , Dorian A. Acevedo-Mejia , David Hester , Daniel McPolin , Karen Rafferty , Debra F. Laefer

In several image acquisition and processing steps of X-ray radiography, knowledge of the existence of metal implants and their exact position is highly beneficial (e.g. dose regulation, image contrast adjustment). Another application which…

图像与视频处理 · 电气工程与系统科学 2022-03-18 Fuxin Fan , Ludwig Ritschl , Marcel Beister , Ramyar Biniazan , Björn Kreher , Tristan M. Gottschalk , Steffen Kappler , Andreas Maier

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a…

计算机视觉与模式识别 · 计算机科学 2024-03-05 Simon Thomine , Hichem Snoussi

The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and…

计算机视觉与模式识别 · 计算机科学 2023-11-22 Peng Wang , Haiming Yao , Wenyong Yu

Surface defect detection of steel, especially the recognition of multi-scale defects, has always been a major challenge in industrial manufacturing. Steel surfaces not only have defects of various sizes and shapes, which limit the accuracy…

图像与视频处理 · 电气工程与系统科学 2025-08-12 Cong Chen , Ming Chen , Hoileong Lee , Yan Li , Jiyang Yu

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…

计算机视觉与模式识别 · 计算机科学 2019-01-25 Weibo Huang , Peng Wei

In the journey of computer vision system development, the acquisition and utilization of annotated images play a central role, providing information about object identity, spatial extent, and viewpoint in depicted scenes. However, thermal…

介观与纳米尺度物理 · 物理学 2025-09-09 Mohsen Asghari Ilani , Yaser Mike Banad

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted…

计算机视觉与模式识别 · 计算机科学 2021-09-14 Yehonatan Fridman , Matan Rusanovsky , Gal Oren

The traceability of granite blocks consists in identifying each block with a finite number of color bands which represent a numerical code. This code has to be read several times throughout the manufacturing process, but its accuracy is…

计算机视觉与模式识别 · 计算机科学 2022-07-05 Xurxo Rigueira , Javier Martinez , Maria Araujo , Antonio Recaman

A methodology is proposed, which addresses the caveat that line-of-sight emission spectroscopy presents in that it cannot provide spatially resolved temperature measurements in nonhomogeneous temperature fields. The aim of this research is…

机器学习 · 计算机科学 2022-12-16 Ruiyuan Kang , Dimitrios C. Kyritsis , Panos Liatsis

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

计算机视觉与模式识别 · 计算机科学 2025-06-05 Chien-Fu , Huang , Katherine Sieg , Leonid Karlinksy , Nash Flores , Rebekah Sheraw , Xin Zhang
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