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The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous…

机器学习 · 计算机科学 2024-09-17 Ka Nam Canaan Law , Mingshuo Yu , Lianglei Zhang , Yiyi Zhang , Peng Xu , Jerry Gao , Jun Liu

Structural integrity is vital for maintaining the safety and longevity of concrete infrastructures such as bridges, tunnels, and walls. Traditional methods for detecting damages like cracks and spalls are labor-intensive, time-consuming,…

计算机视觉与模式识别 · 计算机科学 2025-01-22 Saeid Ataei , Saeed Adibnazari , Seyyed Taghi Ataei

Dents on the aircraft skin are frequent and may easily go undetected during airworthiness checks, as their inspection process is tedious and extremely subject to human factors and environmental conditions. Nowadays, 3D scanning technologies…

计算机视觉与模式识别 · 计算机科学 2023-02-27 Pasquale Lafiosca , Ip-Shing Fan , Nicolas P. Avdelidis

Visual anomaly detection targets to detect images that notably differ from normal pattern, and it has found extensive application in identifying defective parts within the manufacturing industry. These anomaly detection paradigms…

计算机视觉与模式识别 · 计算机科学 2024-11-15 Anindya Sundar Das , Guansong Pang , Monowar Bhuyan

Visual defect detection is critical to ensure the quality of most products. However, the majority of small and medium-sized manufacturing enterprises still rely on tedious and error-prone human manual inspection. The main reasons include:…

计算机视觉与模式识别 · 计算机科学 2022-02-15 Zijian Kuang , Xinran Tie , Lihang Ying , Shi Jin

In a critical software system, the testers have to spend an enormous amount of time and effort to maintain the software due to the continuous occurrence of defects. Among such defects, some severe defects may adversely affect the software.…

软件工程 · 计算机科学 2022-10-11 Umamaheswara Sharma B , Ravichandra Sadam

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the…

机器学习 · 计算机科学 2024-03-21 Kamal Taha

Concerning machine learning, segmentation models can identify state changes within time series, facilitating the detection of transitions between normal and anomalous conditions. Specific techniques such as Change Point Detection (CPD),…

机器学习 · 计算机科学 2025-10-13 Emilio Mastriani , Alessandro Costa , Federico Incardona , Kevin Munari , Sebastiano Spinello

A maximally stable extreme region (MSER) analysis based convolutional neural network (CNN) for unified defect detection framework is proposed in this paper. Our proposed framework utilizes the generality and stability of MSER to generate…

信号处理 · 电气工程与系统科学 2020-05-26 Zelin Deng , Xiaolong Yan , Shengjun Zhang , Colleen P. Bailey

Detecting subtle defects in window frames, including dents and scratches, is vital for upholding product integrity and sustaining a positive brand perception. Conventional machine vision systems often struggle to identify these defects in…

图像与视频处理 · 电气工程与系统科学 2023-09-14 Jorge Vasquez , Hemant K. Sharma , Tomotake Furuhata , Kenji Shimada

Smart manufacturing systems are being deployed at a growing rate because of their ability to interpret a wide variety of sensed information and act on the knowledge gleaned from system observations. In many cases, the principal goal of the…

This paper presents a CAD-based approach for automated surface defect detection. We leverage the a-priori knowledge embedded in a CAD model and integrate it with point cloud data acquired from commercially available stereo and depth…

计算机视觉与模式识别 · 计算机科学 2025-01-31 Matteo Dalle Vedove , Matteo Bonetto , Edoardo Lamon , Luigi Palopoli , Matteo Saveriano , Daniele Fontanelli

In manufacture, steel and other metals are mainly cut and shaped during the fabrication process by computer numerical control (CNC) machines. To keep high productivity and efficiency of the fabrication process, engineers need to monitor the…

机器学习 · 计算机科学 2018-08-17 Guang Li , Xin Yang , Duanbing Chen , Anxing Song , Yuke Fang , Junlin Zhou

Ensuring traffic safety is crucial, which necessitates the detection and prevention of road surface defects. As a result, there has been a growing interest in the literature on the subject, leading to the development of various road surface…

计算机视觉与模式识别 · 计算机科学 2024-02-08 Jongmin Yu , Jiaqi Jiang , Sebastiano Fichera , Paolo Paoletti , Lisa Layzell , Devansh Mehta , Shan Luo

Conformal Prediction (CP) is a distribution-free method for constructing prediction sets with marginal finite-sample coverage guarantees, making it a suitable framework for reliable uncertainty quantification in safety-critical object…

计算机视觉与模式识别 · 计算机科学 2026-05-11 Christopher Ries , Moussa Kassem Sbeyti , Nicolas Bianco , Nadja Klein

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

计算机视觉与模式识别 · 计算机科学 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

Object detection neural network models need to perform reliably in highly dynamic and safety-critical environments like automated driving or robotics. Therefore, it is paramount to verify the robustness of the detection under unexpected…

计算机视觉与模式识别 · 计算机科学 2022-09-08 Syed Qutub , Florian Geissler , Yang Peng , Ralf Grafe , Michael Paulitsch , Gereon Hinz , Alois Knoll

Quality control at each stage of production in textile industry has become a key factor to retaining the existence in the highly competitive global market. Problems of manual fabric defect inspection are lack of accuracy and high time…

计算机视觉与模式识别 · 计算机科学 2014-05-26 Md. Tarek Habib , Rahat Hossain Faisal , M. Rokonuzzaman , Farruk Ahmed

The openness of modern IT systems and their permanent change make it challenging to keep these systems secure. A combination of regression and security testing called security regression testing, which ensures that changes made to a system…

密码学与安全 · 计算机科学 2023-09-19 Irdin Pekaric , Clemens Sauerwein , Michael Felderer

From a process development perspective, diamond growth via chemical vapor deposition has made significant strides. However, challenges persist in achieving high quality and large-area material production. These difficulties include…

计算机视觉与模式识别 · 计算机科学 2024-04-12 Rohan Reddy Mekala , Elias Garratt , Matthias Muehle , Arjun Srinivasan , Adam Porter , Mikael Lindvall