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In the manufacturing industry, defect detection is an essential but challenging task aiming to detect defects generated in the process of production. Though traditional YOLO models presents a good performance in defect detection, they still…

计算机视觉与模式识别 · 计算机科学 2024-12-06 Zuo Zuo , Jiahao Dong , Yue Gao , Zongze Wu

Spins in solid-state materials, molecules, and other chemical systems have the potential to impact the fields of quantum sensing, communication, simulation, and computing. In particular, color centers in diamond, such as negatively charged…

Annotation and labeling of images are some of the biggest challenges in applying deep learning to medical data. Current processes are time and cost-intensive and, therefore, a limiting factor for the wide adoption of the technology.…

计算机视觉与模式识别 · 计算机科学 2023-04-04 Manuel Zahn , Douglas P. Perrin

The effectiveness of machine learning in metallographic microstructure segmentation is often constrained by the lack of human-annotated phase masks, particularly for rare or compositionally complex morphologies within the metal alloy. We…

计算机视觉与模式识别 · 计算机科学 2025-08-05 Hoang Hai Nam Nguyen , Minh Tien Tran , Hoheok Kim , Ho Won Lee

Recent vision language models (VLMs) like CLIP have demonstrated impressive anomaly detection performance under significant distribution shift by utilizing high-level semantic information through text prompts. However, these models often…

计算机视觉与模式识别 · 计算机科学 2026-02-12 Nadeem Nazer , Hongkuan Zhou , Lavdim Halilaj , Ylli Sadikaj , Steffen Staab

This paper introduces Ali-AUG, a novel single-step diffusion model for efficient labeled data augmentation in industrial applications. Our method addresses the challenge of limited labeled data by generating synthetic, labeled images with…

计算机视觉与模式识别 · 计算机科学 2024-10-25 Ali Hamza , Aizea Lojo , Adrian Núñez-Marcos , Aitziber Atutxa

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

计算机视觉与模式识别 · 计算机科学 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…

计算机视觉与模式识别 · 计算机科学 2025-07-09 Shuai Li , Shihan Chen , Wanru Geng , Zhaohua Xu , Xiaolu Liu , Can Dong , Zhen Tian , Changlin Chen

Deviations from the perfect atomic arrangements in crystals play an important role in affecting their properties. Similarly, diffusion of such deviations is behind many microstructural changes in solids. However, observation of point defect…

材料科学 · 物理学 2014-07-28 Jani Kotakoski , Clemens Mangler , Jannik C. Meyer

Extended defects such as dislocation networks and general grain boundaries are ubiquitous in metals, and accurately modeling these extensive defects is crucial for understanding their deformation mechanisms. Existing machine learning…

材料科学 · 物理学 2025-06-10 Fei Shuang , Kai Liu , Yucheng Ji , Wei Gao , Luca Laurenti , Poulumi Dey

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production…

计算机视觉与模式识别 · 计算机科学 2024-09-11 Tianwu Lei , Bohan Wang , Silin Chen , Shurong Cao , Ningmu Zou

Mass-produced optical lenses often exhibit defects that alter their scattering properties and compromise quality standards. Manual inspection is usually adopted to detect defects, but it is not recommended due to low accuracy, high error…

计算机视觉与模式识别 · 计算机科学 2025-02-12 Habib Yaseen

Highly periodic structures are often said to convey the beauty of nature. However, most material properties are strongly influenced by the defects they contain. On the mesoscopic scale, molecular self-assembly exemplifies this interplay;…

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

计算机视觉与模式识别 · 计算机科学 2023-07-04 Wenbo Sun , Raed Al Kontar , Judy Jin , Tzyy-Shuh Chang

Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly:…

计算机视觉与模式识别 · 计算机科学 2021-07-23 Pierre Gutierrez , Maria Luschkova , Antoine Cordier , Mustafa Shukor , Mona Schappert , Tim Dahmen

We show that the orientation of nitrogen-vacancy (NV) defects in diamond can be efficiently controlled through chemical vapor deposition (CVD) growth on a (111)-oriented diamond substrate. More precisely, we demonstrate that spontaneously…

材料科学 · 物理学 2015-06-18 M. Lesik , J. -P. Tetienne , A. Tallaire , J. Achard , V. Mille , A. Gicquel , J. -F. Roch , V. Jacques

Defects influence the properties and functionality of all crystalline materials. For instance, point defects participate in electronic (e.g. carrier generation and recombination) and optical (e.g. absorption and emission) processes critical…

材料科学 · 物理学 2020-06-17 Sunghyun Kim , Samantha N. Hood , Ji-Sang Park , Lucy D. Whalley , Aron Walsh

Leather is a natural and durable material created through a process of tanning of hides and skins of animals. The price of the leather is subjective as it is highly sensitive to its quality and surface defects condition. In the literature,…

计算机视觉与模式识别 · 计算机科学 2019-03-29 Sze-Teng Liong , Y. S. Gan , Yen-Chang Huang , Chang-Ann Yuan , Hsiu-Chi Chang

In this research, we introduce a unified end-to-end Automated Defect Classification-Detection-Segmentation (ADCDS) framework for classifying, detecting, and segmenting multiple instances of semiconductor defects for advanced nodes. This…

计算机视觉与模式识别 · 计算机科学 2024-09-09 Bappaditya Dey , Matthias Monden , Victor Blanco , Sandip Halder , Stefan De Gendt

The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…