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A metallic ring based, diode-integrated, low-profile, power-dependent, reflective metasurface working from 3 GHz to 3.6 GHz is proposed in this letter. Unlike the previous study which shifts a band up and down to change the impedance of the…

应用物理 · 物理学 2022-06-15 Xiaozhen Yang , Erda Wen , Daniel F. Sievenpiper

The rapid rise of artificial intelligence, and in-memory computing has reinvigorated research on scalable, energy-efficient, and reconfigurable photonic hardware. Non-volatile phase-change materials (PCMs) are attractive, as they offer…

Future telescopes will characterize rocky exoplanets in reflected light, revealing their albedo, which depends on surface, cloud, and atmospheric properties. Identifying these features is crucial for assessing habitability. We present…

地球与行星天体物理 · 物理学 2025-04-09 Giulia Roccetti , Claudia Emde , Michael F. Sterzik , Mihail Manev , Julia V. Seidel , Stefano Bagnulo

Huygens' metasurfaces are electrically thin devices which allow arbitrary field transformations. Beam refraction is among the first demonstrations of realized metasurfaces. As previously shown for extreme-angle refraction, control over only…

应用物理 · 物理学 2018-12-13 Michael Chen , Elena Abdo-Sánchez , Ariel Epstein , George V. Eleftheriades

We present a differentiable framework to adaptively compute 4D illumination conditions with respect to an object, for efficient, high-quality simultaneous acquisition of its shape and reflectance, with a unified spatial-angular structured…

计算机视觉与模式识别 · 计算机科学 2026-05-08 Huakeng Ding , Yaowen Chen , Kun Zhou , Hongzhi Wu

Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…

Complex oxide thin films and heterostructures exhibit a profusion of exotic phenomena, often resulting from the intricate interplay between film and substrate. Recently it has become possible to isolate epitaxially grown single-crystalline…

Accurate computational ptychographic phase reconstructions are enabled by fast direct-electron cameras with high dynamic ranges used for four-dimensional scanning transmission electron microscopy (4D-STEM). The availability of open software…

材料科学 · 物理学 2025-05-01 Toma Susi

Optoelectronic micro- and nanostructures have a vast parameter space to explore for modification and optimisation of their functional performance. This paper reports on a data-led approach using high-throughput single nanostructure…

We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The…

Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…

图像与视频处理 · 电气工程与系统科学 2025-01-28 Tao Liu , Bingyang Wang , JiangTao Zhao , Maik Kahnt , Fucai Zhang

Real-space imaging of three-dimensional atomic structures is a critical yet challenging task in materials science. Although scanning transmission electron microscopy has achieved sub-angstrom lateral resolution through techniques like…

We investigate the potential of epitaxial (001)p-NiO/(0001)n-ZnO heterostructures grown on (0001)sapphire substrates by pulsed laser deposition technique for ultraviolet photodetector application. Our study reveals that in the self-powered…

应用物理 · 物理学 2024-09-25 Amandeep Kaur , Bhabani Prasad Sahu , Ajoy Biswas , Subhabrata Dhar

Structural colors generated due to light scattering from static all-dielectric metasurfaces have successfully enabled high-resolution, high-saturation, and wide-gamut color printing applications. Despite recent advances, most demonstrations…

Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the beam, however, have not progressed to the same degree. There…

应用物理 · 物理学 2019-07-24 Matthew Zotta , Sharadh Jois , Prathamesh Dhakras , Miguel Rodriguez , Ji Ung Lee

One of the frontiers in electron scattering is to couple ultrafast temporal resolution with highly localized probes to investigate the role of microstructure on material properties. Here, taking advantage of the unprecedented average…

应用物理 · 物理学 2019-06-07 Fu-Hao Ji , Daniel Durham , Andrew Minor , Pietro Musumeci , Jorge Navarro , Daniele Filippetto

Ultraviolet (UV) imagers are important for a variety of applications, such as quality inspection in the semiconductor industry, forensics and food quality inspection, but are often costly because they require dedicated semiconductor process…

仪器与探测器 · 物理学 2026-01-05 Suman Kundu , Tao Shen , Kai Betlem , Murali K Ghatkesar , Peter G Steeneken , Frans P Widdershoven

We present an infrared photodetector leveraging an all-epitaxial device architecture consisting of a 'designer' plasmonic metal integrated with a quantum-engineered detector structure, all in a mature III-V semiconductor material system.…

Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are…

We present a novel method to measure transient photovoltage at nanointerfaces using ultrafast electron diffraction. In particular, we report our results on the photoinduced electronic excitations and their ensuing relaxations in a…

材料科学 · 物理学 2009-11-13 Ryan A. Murdick , Ramani K. Raman , Yoshie Murooka , Chong-Yu Ruan