相关论文: Polarization sensitivity in scattering-type scanni…
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase…
We analyze how a probing particle modifies the infrared electromagnetic near field of a sample. The particle, described by electric and magnetic polarizabilities, represents the tip of an apertureless scanning optical near-field microscope…
We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic…
Scattering-type scanning near-field optical microscope (s-SNOM) has become an essential tool to study polaritons - quasiparticles of light coupled to collective charge oscillations - via direct probing of their near field with a spatial…
Scattering-type scanning near-field optical microscopy (s-SNOM) enables sub-diffraction spectroscopy, featuring high sensitivity to small spatial permittivity variations of the sample surface. However, due to the near-field probe-sample…
We study the response of a conical metallic surface to an external electromagnetic (EM) field by representing the fields in basis functions containing integrable singularities at the tip of the cone. A fast analytical solution is obtained…
Scanning near-field field optical microscopy (SNOM) is a technique, which allows sub-wavelength optical imaging of photonic structures. While the electric field components of light can be routinely obtained, imaging of the magnetic…
We analyse how a probing particle modifies infrared electromagnetic near fields. The particle, assimilated to both electric and magnetic dipoles, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…
Near-field optical microscopes with two independent tips for simultaneous excitation and detection can be essential tools for studying localized optical phenomena on the subwavelength scale. Here, we report on the implementation of a fully…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
Scattering-type scanning near-field optical microscopy (s-SNOM) is a versatile technique in nanooptics, enabling local probing of optical responses beyond the diffraction limit from vis to THz frequencies. Its theoretical modeling based on…
Localized and propagating polaritons allow for highly sensitive analysis of (bio)chemical substances and processes. Nanoimaging of the polaritons evanescent fields allows for critically important experimental mode identification and for…
Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently…
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy…
Inelastic interaction of free-electrons with optical near fields has recently attracted attention for manipulating and shaping free-electron wavepackets. Understanding the nature and the dependence of the inelastic cross section on the…
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…
Undoubtedly, Raman spectroscopy is one of the most elaborated spectroscopy tools in materials science, chemistry, medicine and optics. However, when it comes to the analysis of nanostructured specimens, accessing the Raman spectra resulting…
We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy…
Light scattering techniques are widely used in many fields of condensed and sof t matter physics. Usually these methods are based on the study of the scattered light in the far field. Recently, a new family of near field detection schemes…