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Enhancing the visibility in extreme low-light environments is a challenging task. Under nearly lightless condition, existing image denoising methods could easily break down due to significantly low SNR. In this paper, we systematically…

图像与视频处理 · 电气工程与系统科学 2021-08-05 Kaixuan Wei , Ying Fu , Yinqiang Zheng , Jiaolong Yang

Scanning Electron Microscopes (SEMs) are widely renowned for their ability to analyze the surface structures of microscopic objects, offering the capability to capture highly detailed, yet only grayscale, images. To create more expressive…

计算机视觉与模式识别 · 计算机科学 2024-10-30 Takuma Nishimura , Andreea Dogaru , Martin Oeggerli , Bernhard Egger

A Single Ensemble Empirical Mode Decomposition (SEEMD) is proposed for locating the damage in rolling element bearings. The SEEMD does not require a number of ensembles from the addition or subtraction of noise every time while processing…

信号处理 · 电气工程与系统科学 2025-02-13 Yaakoub Berrouche , Govind Vashishtha , Sumika Chauhan , Radoslaw Zimroz

Introduction. Noisy measurements frequently cause noisy and inaccurate images in impedance imaging. No post-processing technique exists to calculate the propagation of measurement noise and use this to suppress noise in the image.…

医学物理 · 物理学 2024-03-13 Kai Mason , Florencia Maurino-Alperovich , David Holder , Kirill Aristovich

In burst-mode communication systems, the quality of frame synchronization (FS) at receivers significantly impacts the overall system performance. To guarantee FS, an extreme learning machine (ELM)-based synchronization method is proposed to…

信号处理 · 电气工程与系统科学 2020-02-19 Chaojin Qing , Wang Yu , Bin Cai , Jiafan Wang , Chuan Huang

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…

计算物理 · 物理学 2023-03-31 I. Lobato , T. Friedrich , S. Van Aert

sEMG pattern recognition algorithms have been explored extensively in decoding movement intent, yet are known to be vulnerable to changing recording conditions, exhibiting significant drops in performance across subjects, and even across…

机器学习 · 计算机科学 2024-01-08 Joao Pereira , Dimitrios Chalatsis , Balint Hodossy , Dario Farina

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

计算机视觉与模式识别 · 计算机科学 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

Noisy images processing is a fundamental task of computer vision. The first example is the detection of faint edges in noisy images, a challenging problem studied in the last decades. A recent study introduced a fast method to detect faint…

计算机视觉与模式识别 · 计算机科学 2021-10-06 Nati Ofir , Yosi Keller

Scanning tunneling microscopy (STM) and micro-electromechanical systems (MEMS) have traditionally addressed vastly different length scales - one resolving atoms, the other engineering macroscopic motion. Here we unite these two fields to…

介观与纳米尺度物理 · 物理学 2026-01-09 R. J. G. Elbertse , M. Xu , A. Keşkekler , S. Otte , R. A. Norte

The semi-airborne transient electromagnetic method (SATEM) is capable of conducting rapid surveys over large-scale and hard-to-reach areas. However, the acquired signals are often contaminated by complex noise, which can compromise the…

机器学习 · 计算机科学 2025-03-31 Shuang Wang , Ming Guo , Xuben Wang , Fei Deng , Lifeng Mao , Bin Wang , Wenlong Gao

Many imaging modalities involve reconstruction of unknown objects from collections of noisy projections related by random rotations. In one of these modalities, cryogenic electron microscopy (cryo-EM), the extremely low signal-to-noise…

图像与视频处理 · 电气工程与系统科学 2025-10-16 Joakim Andén , Justus Sagemüller

Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involves time-consuming manual structural identification. We have…

Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…

After the discovery of GMR by Fert and Gr\"unberg, electronics had a breakthrough with the birth of a new branch called spintronics. This discipline, while still young, exploits the spin of electrons. Most quantum devices exploiting this…

介观与纳米尺度物理 · 物理学 2015-01-27 Yann Claveau

Detecting nanomechanical motion has become an important challenge in Science and Technology. Recently, electromechanical coupling to focused electron beams has emerged as a promising method adapted to ultra-low scale systems. However the…

Reliable analysis of intracellular dynamic processes in time-lapse fluorescence microscopy images requires complete and accurate tracking of all small particles in all time frames of the image sequences. A fundamental first step towards…

图像与视频处理 · 电气工程与系统科学 2024-08-16 Yao Yao , Ihor Smal , Ilya Grigoriev , Anna Akhmanova , Erik Meijering

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

Estimating noise information exactly is crucial for noise aware training in speech applications including speech enhancement (SE) which is our focus in this paper. To estimate noise-only frames, we employ voice activity detection (VAD) to…

音频与语音处理 · 电气工程与系统科学 2020-12-04 Joohyung Lee , Youngmoon Jung , Myunghun Jung , Hoirin Kim

Micro-Electro-Mechanical Systems (MEMS) normally have fixed or moving structures with cross-sections of the order of microns ($\mu m$) and lengths of the order of tens or hundreds of microns. These structures are often plates or array of…

计算物理 · 物理学 2007-05-23 N. Majumdar , S. Mukhopadhyay