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Accurately measuring the size, morphology, and structure of nanoparticles is very important, because they are strongly dependent on their properties for many applications. In this paper, we present a deep-learning based method for…

A method for automated quantification of the alignment of one-dimensional nanostructures from microscopy imaging is presented. Nanostructure alignment metrics are formulated and shown to able to rigorously quantify the orientational order…

仪器与探测器 · 物理学 2016-08-03 Jianjin Dong , Irene A. Goldthorpe , Nasser Mohieddin Abukhdeir

Image decomposition plays a crucial role in various computer vision tasks, enabling the analysis and manipulation of visual content at a fundamental level. Overlapping images, which occur when multiple objects or scenes partially occlude…

计算机视觉与模式识别 · 计算机科学 2024-06-06 Saúl Alonso-Monsalve , Davide Sgalaberna , Xingyu Zhao , Adrien Molines , Clark McGrew , André Rubbia

A wide range of techniques can be considered for segmentation of images of nanostructured surfaces. Manually segmenting these images is time-consuming and results in a user-dependent segmentation bias, while there is currently no consensus…

图像与视频处理 · 电气工程与系统科学 2020-08-31 Steff Farley , Jo E. A. Hodgkinson , Oliver M. Gordon , Joanna Turner , Andrea Soltoggio , Philip J. Moriarty , Eugenie Hunsicker

Segmentation of overlapping convex objects has various applications, for example, in nanoparticles and cell imaging. Often the segmentation method has to rely purely on edges between the background and foreground making the analyzed images…

计算机视觉与模式识别 · 计算机科学 2019-06-05 Sahar Zafari , Mariia Murashkina , Tuomas Eerola , Jouni Sampo , Heikki Kälviäinen , Heikki Haario

The nanoparticle size and distribution information in the SEM images of silicon crystals are generally counted by manual methods. The realization of automatic machine recognition is significant in materials science. This paper proposed a…

计算机视觉与模式识别 · 计算机科学 2022-06-07 Ruiling Xiao , Jiayang Niu

Artificial Intelligence & Nanotechnology are promising areas for the future of humanity. While Deep Learning based Computer Vision has found applications in many fields from medicine to automotive, its application in nanotechnology can open…

计算机视觉与模式识别 · 计算机科学 2022-01-05 Rajagopal A , Nirmala V , Andrew J , Arun Muthuraj Vedamanickam.

Object segmentation and structure localization are important steps in automated image analysis pipelines for microscopy images. We present a convolution neural network (CNN) based deep learning architecture for segmentation of objects in…

计算机视觉与模式识别 · 计算机科学 2019-01-24 Shan E Ahmed Raza , Linda Cheung , Muhammad Shaban , Simon Graham , David Epstein , Stella Pelengaris , Michael Khan , Nasir M. Rajpoot

Precise analysis of nanoparticles for characterization in electron microscopy images is essential for advancing nanomaterial development. Yet it remains challenging due to the time-consuming nature of manual methods and the shortcomings of…

计算机视觉与模式识别 · 计算机科学 2026-04-07 Anindya Pal , Varun Ajith , Saumik Bhattacharya , Sayantari Ghosh

In this work, we propose a new segmentation algorithm for images containing convex objects present in multiple shapes with a high degree of overlap. The proposed algorithm is carried out in two steps, first we identify the visible contours,…

计算机视觉与模式识别 · 计算机科学 2017-11-08 Kumar Abhinav , Jaideep Singh Chauhan , Debasis Sarkar

Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…

In this study, we present a computational framework tailored for the precise detection and comprehensive analysis of nanoparticles within scanning electron microscopy (SEM) images. The primary objective of this framework revolves around the…

图像与视频处理 · 电气工程与系统科学 2023-08-21 Aidan S. Wright , Nathaniel P. Youmans , Enrique F. Valderrama Araya

Minerals, metals, and plastics are indispensable for a functioning modern society. Yet, their supply is limited causing a need for optimizing ore extraction and recuperation from recyclable materials.Typically, those processes must be…

计算机视觉与模式识别 · 计算机科学 2023-12-15 Karol Gotkowski , Shuvam Gupta , Jose R. A. Godinho , Camila G. S. Tochtrop , Klaus H. Maier-Hein , Fabian Isensee

Single-shot wide-angle diffraction imaging is a widely used method to investigate the structure of non-crystallizing objects such as nanoclusters, large proteins or even viruses. Its main advantage is that information about the…

数据分析、统计与概率 · 物理学 2021-06-02 Thomas Stielow , Stefan Scheel

Image segmentation is a fundamental and challenging problem in computer vision with applications spanning multiple areas, such as medical imaging, remote sensing, and autonomous vehicles. Recently, convolutional neural networks (CNNs) have…

计算机视觉与模式识别 · 计算机科学 2020-06-24 Ali Hatamizadeh

A powerful technique is introduced for simulating mechanical and electromechanical properties of one-dimensional nanostructures under arbitrary combinations of bending, twisting, and stretching. The technique is based on a novel control of…

介观与纳米尺度物理 · 物理学 2016-09-28 Pekka Koskinen

Determining the dimensions of nanostructures is critical to ensuring the maximum performance of many geometry-sensitive nanoscale functional devices. However, accurate metrology at the nanoscale is difficult using optics-based methods due…

应用物理 · 物理学 2019-08-21 Jinlong Zhu , Yanan Liu , Sanyogita Purandare , Jian-Ming Jin , Shiyuan Liu , Lynford L. Goddard

Nanoparticle superlattices consisting of ordered arrangements of nanoparticles exhibit unique optical, magnetic, and electronic properties arising from nanoparticle characteristics as well as their collective behaviors. Understanding how…

材料科学 · 物理学 2025-01-09 Aanish Paruchuri , Carl Thrasher , A. J. Hart , Robert Macfarlane , Arthi Jayaraman

Accurate and efficient characterization of nanoparticles (NPs), particularly regarding particle size distribution, is essential for advancing our understanding of their structure-property relationships and facilitating their design for…

材料科学 · 物理学 2024-10-03 Arda Genc , Justin Marlowe , Anika Jalil , Libor Kovarik , Phillip Christopher

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

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