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The direction of ferroelectric polarization is prescribed by the symmetry of the crystal structure. Therefore, rotation of the polarization direction is largely limited, despite the opportunity it offers in understanding important…

Ferroelectric HfO2-based materials hold great potential for widespread integration of ferroelectricity into modern electronics due to their robust ferroelectric properties at the nanoscale and compatibility with the existing Si technology.…

Ferroelectric HfO2 is a promising candidate for next-generation memory devices due to its CMOS compatibility and ability to retain polarization at nanometer scales. However, the polar orthorhombic phase (Pca2_1) responsible for…

材料科学 · 物理学 2026-03-27 Jian Huang , Gwan Yeong Jung , Pravan Omprakash , Guodong Ren , Xin Li , Du Li , Xiaoshan Xu , Li Yang , Rohan Mishra

Understanding the nature of sliding ferroelectricity is of fundamental importance for the discovery and application of two-dimensional ferroelectric materials. In this work, we investigate the phenomenon of switchable polarization in a…

介观与纳米尺度物理 · 物理学 2023-11-22 Dongyang Yang , Jing Liang , Jingda Wu , Yunhuan Xiao , Jerry I. Dadap , Kenji Watanabe , Takashi Taniguchi , Ziliang Ye

Hafnia (HfO$_2$)-based thin films have promising applications in nanoscale electronic devices due to their robust ferroelectricity and integration with silicon. However, HfO$_2$ has various stable and metastable polymorphs with quite…

Under a sufficiently high applied electric field, a non-polar antiferroelectric material, such as \ce{PbZrO3}, can undergo a rapid transformation to a polar ferroelectric phase. While this behavior is promising for energy storage and…

Ferroelectricity observed in thin film $\mathrm{HfO_2}$, either doped with Si, Al, etc. or in the $\mathrm{Hf_{0.5}Zr_{0.5}O_2}$ form, has gained great technical significance. However, the soft mode theory faces a difficulty in explaining…

The structural, thermal, and dielectric properties of the ferroelectric phase of HfO$_2$, ZrO$_2$ and Hf$_{0.5}$ Zr$_{0.5}$ O$_2$ (HZO) are investigated with carefully validated density functional computations. We find, that the free bulk…

材料科学 · 物理学 2015-07-03 Robin Materlik , Christopher Künneth , Alfred Kersch

Hybrid improper ferroelectricity, where an electrical polarization can be induced via a trilinear coupling to two non-polar structural distortions of different symmetry, has recently been experimentally demonstrated for the first time in…

材料科学 · 物理学 2016-10-05 Elizabeth A. Nowadnick , Craig J. Fennie

We investigated domain kinetics by measuring the polarization switching behaviors of polycrystalline Pb(Zr,Ti)O$_{3}$ films, which are widely used in ferroelectric memory devices. Their switching behaviors at various electric fields and…

材料科学 · 物理学 2009-11-13 J. Y. Jo , H. S. Han , J. -G. Yoon , T. K. Song , S. -H. Kim , T. W. Noh

Ferroelectric switching in BiFeO$_3$ multiferroic thin films with intrinsic ``stripe-like'' and ``bubble-like'' polydomain configurations was studied by piezoresponse force microscopy. Using the local electric field applied by a scanning…

材料科学 · 物理学 2009-07-28 H. Béa , M. Bibes , A. Barthélémy , P. Paruch

A comparative theoretical study is presented for the rhombohedral R3 and R3m phase HfO2, of two possible forms in its heavily Zr-doped ferroelectric thin films found recently in experiments. Their structural stability and polarization under…

材料科学 · 物理学 2023-07-03 Wenbin Ouyang , Fanghao Jia , Wei Ren

Ferroelectric HfO$_2$ has emerged as a highly promising material for high-density nonvolatile memory and nanoscale transistor applications. However, the uncertain origin of polarization in HfO$_2$ limits our ability to fully understand and…

材料科学 · 物理学 2026-03-11 Seongjoo Jung , Turan Birol

Fluorite-type $\mathrm{HfO_2}$-based ferroelectric (FE) oxides have rekindled interest in FE memories due to their compatibility with silicon processing and potential for high-density integration. The polarization characteristics of FE…

HfO$_2$- and ZrO$_2$-based ferroelectric thin films have emerged as promising candidates for the gate oxides of next generation electronic devices. Recent work has experimentally demonstrated that a tetragonal/orthorhombic (t/o-) phase…

介观与纳米尺度物理 · 物理学 2024-03-11 Prabhat Kumar , Michael Hoffmann , Andrew Nonaka , Sayeef Salahuddin , Zhi Yao

Ferroelectric Hf0.5Zr0.5O2 (HZO) thin films are promising for next-generation memory and logic devices due to their CMOS compatibility and scalability. The spatial uniformity of the orthorhombic (O) phase is crucial for optimizing…

材料科学 · 物理学 2025-08-05 Wei-Cheng Peng , Hsien-Yang Liu , Cheng-Yu Yu , Artur Useinov , Tian-Li Wu

Understanding the polarization switching mechanisms at play in ferroelectric materials is crucial for their exploitation in electronic devices. The conventional centrosymmetric reference structure-based mechanism which accounts for…

Against expectations, robust switchable ferroelectricity has been recently observed in ultrathin (1 nm) ferroelectric films exposed to air [V. Garcia $et$ $al.$, Nature {\bf 460}, 81 (2009)]. Based on first-principles calculations, we show…

介观与纳米尺度物理 · 物理学 2012-01-10 N. C. Bristowe , Massimiliano Stengel , P. B. Littlewood , J. M. Pruneda , Emilio Artacho

With the recent experimental verification that ferroelectric lattice distortions survive in the metallic phase of some materials, there is a desire to create devices that are both switchable and take advantage of the novel functionalities…

介观与纳米尺度物理 · 物理学 2022-02-10 Kelsey S. Chapman , W. A. Atkinson

The ferroelectric polarization switching in ferroelectric hafnium zirconium oxide (Hf0.5Zr0.5O2, HZO) in the HZO/Al2O3 ferroelectric/dielectric stack is investigated systematically by capacitance-voltage and polarization-voltage…

应用物理 · 物理学 2019-06-25 Mengwei Si , Xiao Lyu , Peide D. Ye