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相关论文: Optimizing the Accuracy of Viscoelastic Characteri…

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Force-distance curve experiments are commonly performed in Atomic Force Microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these…

应用物理 · 物理学 2022-04-25 Berkin Uluutku , Marshall Richards McCraw , Santiago D. Solares

Quantifying the nanomechanical properties of soft-matter using multi-frequency atomic force microscopy (AFM) is crucial for studying the performance of polymers, ultra-thin coatings, and biological systems. Such characterization processes…

In this paper we present a theoretical and experimental study aimed at characterizing the hysteretic properties of viscoelastic materials. In the last decades viscoelastic materials have become a reference for new technological…

仪器与探测器 · 物理学 2021-10-27 Elena Pierro , Giuseppe Carbone

Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…

材料科学 · 物理学 2018-05-07 Oleg K. Garishin , Roman I. Izyumov , Alexander L. Svistkov

Numerical modeling of viscoelastic properties is critical to developing the structure-property relationship of polymer nanocomposites. While it is recognized that the altered polymer region near filler particles, the interphase,…

The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…

介观与纳米尺度物理 · 物理学 2019-04-16 Liam Collins , Yongtao Liu , Olga Ovchinnikova , Roger Proksch

In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…

图像与视频处理 · 电气工程与系统科学 2024-09-23 Aanish Paruchuri , Yunfei Wang , Xiaodan Gu , Arthi Jayaraman

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

介观与纳米尺度物理 · 物理学 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

仪器与探测器 · 物理学 2025-06-10 Simon Laflamme , Bugrahan Guner , Omur E. Dagdeviren

The viscoelastic behavior of wood pulp fibers plays a fundamental role in the performance of paper and paper products. Wood pulp fibers are hierarchical composites consisting of different cell wall layers and have anisotropic properties.…

3D-printed materials are used in many different industries (automotive, aviation, medicine, etc.). Most of these 3D-printed materials are based on ceramics or polymers whose mechanical properties vary with frequency. For numerical modeling,…

应用物理 · 物理学 2025-11-07 Linus Taenzer , Paolo Tiso , Bart Van Damme

Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated analysis tools has been limited. In this paper, we introduce…

This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…

计算工程、金融与科学 · 计算机科学 2025-04-04 Maria Rosaria Marulli , Jacopo Bonari , Pasqualantonio Pingue , Marco Paggi

Atomic Force Microscopy (AFM) combined with electrical modes provides a powerful contactless approach to characterize material electrical properties at the nanoscale. However, conventional electrostatic models often overlook dynamic charge…

介观与纳米尺度物理 · 物理学 2025-08-26 Mario Navarro-Rodriguez , Paul Philip Schmidt , Regina Hoffmann-Vogel , Andres M. Somoza , Elisa Palacios-Lidon

Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

Accurate identification of nonlinear material parameters from three-dimensional full-field deformation data remains a challenge in experimental mechanics. The virtual fields method (VFM) provides a powerful, computationally efficient…

软凝聚态物质 · 物理学 2026-01-21 Denislav P. Nikolov , Zhiren Zhu , Jonathan B. Estrada

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

软凝聚态物质 · 物理学 2007-05-23 Davood Norouzi , Martin Michael Mueller , Markus Deserno

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

应用统计 · 统计学 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

Force versus extension curves measure entropic elasticity of single polymer chain in force spectroscopy experiments. A Worm-like Chain model is used to describe force extension experiments with an intrinsic chain parameter called…

软凝聚态物质 · 物理学 2021-07-28 Vikhyaat Ahlawat , Shatruhansingh Rajput , Shivprasad Patil

We propose an analytical model for the force-indentation relationship in viscoelastic materials exhibiting a power law relaxation described by an exponent n, where n = 1 represents the standard viscoelastic solid (SLS) model, and n < 1…

软凝聚态物质 · 物理学 2017-02-01 J. S. de Sousa , J. A. C. Santos , E. B. Barros , J. Mendes Filho , L . M. R. Alencar , W. T. Cruz , M. V. Ramos
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