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相关论文: Sparse Ellipsometry: Portable Acquisition of Polar…

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We present a novel method for efficient acquisition of shape and spatially varying reflectance of 3D objects using polarization cues. Unlike previous works that have exploited polarization to estimate material or object appearance under…

计算机视觉与模式识别 · 计算机科学 2021-05-07 Valentin Deschaintre , Yiming Lin , Abhijeet Ghosh

Acquisition and modeling of polarized light reflection and scattering help reveal the shape, structure, and physical characteristics of an object, which is increasingly important in computer graphics. However, current polarimetric…

计算机视觉与模式识别 · 计算机科学 2025-01-07 Hyunho Ha , Inseung Hwang , Nestor Monzon , Jaemin Cho , Donggun Kim , Seung-Hwan Baek , Adolfo Muñoz , Diego Gutierrez , Min H. Kim

Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and…

计算机视觉与模式识别 · 计算机科学 2024-12-16 Jing Yang , Pratusha Bhuvana Prasad , Qing Zhang , Yajie Zhao

The challenge of image-based 3D reconstruction for glossy objects lies in separating diffuse and specular components on glossy surfaces from captured images, a task complicated by the ambiguity in discerning lighting conditions and material…

计算机视觉与模式识别 · 计算机科学 2025-04-10 Bojian Wu , Yifan Peng , Ruizhen Hu , Xiaowei Zhou

We propose spatial polarization multiplexing (SPM) for joint sensing of shape and reflectance of a static or dynamic deformable object, which is also invisible to the naked eye. Past structured-light methods are limited to shape acquisition…

计算机视觉与模式识别 · 计算机科学 2026-01-07 Tomoki Ichikawa , Ryo Kawahara , Ko Nishino

Acquiring bidirectional reflectance distribution functions (BRDFs) is essential for simulating light transport and analytically modeling material properties. Over the past two decades, numerous intensity-only BRDF datasets in the visible…

图形学 · 计算机科学 2025-09-18 Yunseong Moon , Ryota Maeda , Suhyun Shin , Inseung Hwang , Youngchan Kim , Min H. Kim , Seung-Hwan Baek

We present a method to capture both 3D shape and spatially varying reflectance with a multi-view photometric stereo (MVPS) technique that works for general isotropic materials. Our algorithm is suitable for perspective cameras and nearby…

计算机视觉与模式识别 · 计算机科学 2020-01-22 Min Li , Zhenglong Zhou , Zhe Wu , Boxin Shi , Changyu Diao , Ping Tan

Light emitted from a source into a scene can undergo complex interactions with scene surfaces of different material types before being reflected. During this transport, every surface reflection is encoded in the properties of the photons…

计算机视觉与模式识别 · 计算机科学 2021-09-16 Seung-Hwan Baek , Felix Heide

Can we capture shape and reflectance in stealth? Such capability would be valuable for many application domains in vision, xR, robotics, and HCI. We introduce structured polarization for invisible depth and reflectance sensing (SPIDeRS),…

计算机视觉与模式识别 · 计算机科学 2024-04-02 Tomoki Ichikawa , Shohei Nobuhara , Ko Nishino

We introduce a novel learning-based method to reconstruct the high-quality geometry and complex, spatially-varying BRDF of an arbitrary object from a sparse set of only six images captured by wide-baseline cameras under collocated point…

计算机视觉与模式识别 · 计算机科学 2020-07-07 Sai Bi , Zexiang Xu , Kalyan Sunkavalli , David Kriegman , Ravi Ramamoorthi

Accurate and fast 3D imaging of specular surfaces still poses major challenges for state-of-the-art optical measurement principles. Frequently used methods, such as phase-measuring deflectometry (PMD) or shape-from-polarization (SfP), rely…

计算机视觉与模式识别 · 计算机科学 2024-06-05 Jiazhang Wang , Oliver Cossairt , Florian Willomitzer

Inverse rendering remains a core challenge in graphics and vision, especially in the snapshot configurations required for lightweight desktop workflows, where the per-frame information budget is highly constrained. Previous inverse…

Accurate BRDF acquisition is essential for realistic rendering, but dense gonioreflectometer measurements are slow and expensive. We study how to select a small set of BRDF measurements that is most informative for reconstructing material…

计算机视觉与模式识别 · 计算机科学 2026-05-26 W. Cao , D. Jönsson , Z. Huang , J. Unger

Ellipsometry is a powerful and well-established optical technique used in the characterisation of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We…

光学 · 物理学 2018-03-15 Manoel P. Araújo , Stefano De Leo , Gabriel G. Maia

Shape from Polarization (SfP) estimates surface normals using photos captured at different polarizer rotations. Fundamentally, the SfP model assumes that light is reflected either diffusely or specularly. However, this model is not valid…

计算机视觉与模式识别 · 计算机科学 2016-06-14 Vage Taamazyan , Achuta Kadambi , Ramesh Raskar

Efficient shape reconstruction for surfaces with complex reflectance properties is crucial for real-time virtual reality. While 3D Gaussian Splatting (3DGS)-based methods offer fast novel view rendering by leveraging their explicit surface…

计算机视觉与模式识别 · 计算机科学 2025-09-25 Yufei Han , Bowen Tie , Heng Guo , Youwei Lyu , Si Li , Boxin Shi , Yunpeng Jia , Zhanyu Ma

Empowered by deep learning, recent methods for material capture can estimate a spatially-varying reflectance from a single photograph. Such lightweight capture is in stark contrast with the tens or hundreds of pictures required by…

图形学 · 计算机科学 2019-06-28 Valentin Deschaintre , Miika Aittala , Fredo Durand , George Drettakis , Adrien Bousseau

Polarimetric imaging is one of the most effective techniques for high-contrast imaging and characterization of circumstellar environments. These environments can be characterized through direct-imaging polarimetry at near-infrared…

天体物理仪器与方法 · 物理学 2021-09-29 Laurence Denneulin , Maud Langlois , Éric Thiébaut , Nelly Pustelnik

In this work, we propose a novel method for the detailed reconstruction of transparent objects by exploiting polarimetric cues. Most of the existing methods usually lack sufficient constraints and suffer from the over-smooth problem. Hence,…

计算机视觉与模式识别 · 计算机科学 2022-08-26 Mingqi Shao , Chongkun Xia , Dongxu Duan , Xueqian Wang

Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…

光学 · 物理学 2023-07-14 Shun Wen , Xinyuan Xue , Liqun Sun , Yuanmu Yang
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