相关论文: Optimizing broad ion beam polishing of zircaloy-4 …
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
Collinear laser spectroscopy has been performed on He-like C$^{4+}$ ions extracted from an electron beam ion source (EBIS). In order to determine the transition frequency with the highest-possible accuracy, the lineshape of the fluorescence…
The effect of pulsed laser polishing on rough niobium surfaces was investigated. We created different well-defined roughness profiles with standard emery papers and subsequently remelted random surface areas with a size of about 2x2 mm^2…
Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been…
We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation gradient tensors from experimentally measured Kikuchi…
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a micrograph. Randomness of the number of incident particles…
The convergent beam electron diffraction (CBED) patterns of twisted bilayer samples exhibit interference patterns in their CBED spots. Such interference patterns can be treated as off-axis holograms and the phase of the scattered waves,…
Three dimensional electron back-scattered diffraction (EBSD) microscopy is a critical tool in many applications in materials science, yet its data quality can fluctuate greatly during the arduous collection process, particularly via…
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged…
Three-dimensional magnetic fields (3D B-fields) are essential to understand the formation and evolution of the interstellar medium and multi-scale star formation; however, the accurate measurement of 3D B-fields is still challenging. The…
High angular resolution electron backscatter diffraction (HR-EBSD) was coupled with focused ion beam (FIB) slicing to characterize the shape of the plastic zone in terms of geometrically necessary dislocations (GNDs) in W single crystal in…
The structure of low-carbon steel after twist extrusion is tested with using electron backscattered diffraction. It has been shown that warm twist extrusion results in grain refinement with conservation of a substantial part of high-angle…
During the last few years, serial electron crystallography (Serial Electron Diffraction, SerialED) has been gaining attention for the structure determination of crystalline compounds that are sensitive to the irradiation of the electron…
In the technique of Electron Backscatter Diffraction (EBSD), the accurate detection and identification of different phases existing in a sample is often limited by overlapping Kikuchi diffraction patterns originating from the extended…
Characterization of the structure and properties of materials in three dimensions, including grains and the residual pattern of deformation, provides necessary information required to guide materials design as well as support materials…
We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters…
The development of modern metal deposition techniques like Focused Ion/Electron Beam Induced Deposition FIBID/FEBID relies heavily on the availability of metal-organic precursors of particular properties. To create a new precursor,…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
Y-type hexaferrite samples Ba2ZnxCo2-xFe12O22 with x = 0, 1 and 2 were prepared from precursors synthesized by the citrate sol-gel auto combustion method. The powders were sintered at 1100{\deg} C for four hours. X-ray diffraction, scanning…
Using electrochemical impedance spectroscopy, we have devised a method of sensing the microscopic surface conditions on the surface of niobium as it is undergoing an electrochemical polishing (EP) treatment. The method uses electrochemical…