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相关论文: Ultrafast Focus Detection for Automated Microscopy

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High-resolution transmission electron microscopy (HRTEM) is crucial for observing material's structural and morphological evolution at Angstrom scales, but the electron beam can alter these processes. Devices such as CMOS-based…

材料科学 · 物理学 2025-12-04 Brian Lee , Meng Li , Judith C Yang , Dmitri N Zakharov , Xiaohui Qu

Computer-aided diagnostics has benefited from the development of deep learning-based computer vision techniques in these years. Traditional supervised deep learning methods assume that the test sample is drawn from the identical…

计算机视觉与模式识别 · 计算机科学 2024-07-04 Zesheng Hong , Yubiao Yue , Yubin Chen , Lele Cong , Huanjie Lin , Yuanmei Luo , Mini Han Wang , Weidong Wang , Jialong Xu , Xiaoqi Yang , Hechang Chen , Zhenzhang Li , Sihong Xie

Unsupervised Anomaly Detection has become a popular method to detect pathologies in medical images as it does not require supervision or labels for training. Most commonly, the anomaly detection model generates a "normal" version of an…

图像与视频处理 · 电气工程与系统科学 2023-09-26 Felix Meissen , Johannes Paetzold , Georgios Kaissis , Daniel Rueckert

Holography relies on the interference between a known reference and a signal of interest to reconstruct both the amplitude and phase of that signal. Commonly performed with photons and electrons, it finds numerous applications in imaging,…

Electronic and optoelectronic applications of two-dimensional (2D) semiconductors demand precise control over material quality, including thickness, composition, doping, and defect density. Conventional benchmarking methods (e.g., charge…

The capability of focus control has been central to optical technologies that require both high temporal and spatial resolutions. However, existing varifocal lens schemes are commonly limited to the response time on the microsecond…

Owing to the development and advancement of artificial intelligence, numerous works were established in the human facial expression recognition system. Meanwhile, the detection and classification of micro-expressions are attracting…

计算机视觉与模式识别 · 计算机科学 2019-04-04 Sze-Teng Liong , Y. S. Gan , Danna Zheng , Shu-Meng Lic , Hao-Xuan Xua , Han-Zhe Zhang , Ran-Ke Lyu , Kun-Hong Liu

Identifying complex neural circuitry from electron microscopic (EM) images may help unlock the mysteries of the brain. However, identifying this circuitry requires time-consuming, manual tracing (proofreading) due to the size and intricacy…

定量方法 · 定量生物学 2014-09-04 Stephen M. Plaza

Autofocus (AF) methods are extensively used in biomicroscopy, for example to acquire timelapses, where the imaged objects tend to drift out of focus. AD algorithms determine an optimal distance by which to move the sample back into the…

图像与视频处理 · 电气工程与系统科学 2021-01-14 Adrian Shajkofci , Michael Liebling

In the last decade, the development of Ultrafast Electron Diffraction (UED) and Microscopy (UEM) has enabled the imaging of atomic motion in real time and space. These pivotal table-top tools opened the door for a vast range of applications…

化学物理 · 物理学 2018-01-16 Mohammed Th. Hassan

We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…

计算机视觉与模式识别 · 计算机科学 2019-08-21 Kevin de Haan , Zachary S. Ballard , Yair Rivenson , Yichen Wu , Aydogan Ozcan

Edge detection is crucial in medical image processing, enabling precise extraction of structural information to support lesion identification and image analysis. Traditional edge detection models typically rely on complex Convolutional…

计算机视觉与模式识别 · 计算机科学 2024-08-09 Fuzhang Li , Chuan Lin

Non-invasive detection of microvascular alterations in deep tissues in vivo provides critical information for clinical diagnosis and evaluation of a broad-spectrum of pathologies. Recently, the emergence of super-resolution ultrasound…

Automated experiments in scanning transmission electron microscopy (STEM) require rapid image segmentation to optimize data representation for human interpretation, decision-making, site-selective spectroscopies, and atomic manipulation.…

Medical imaging plays a vital role in modern diagnostics; however, interpreting high-resolution radiological data remains time-consuming and susceptible to variability among clinicians. Traditional image processing techniques often lack the…

计算机视觉与模式识别 · 计算机科学 2025-10-21 Melika Filvantorkaman , Maral Filvan Torkaman

Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…

材料科学 · 物理学 2011-12-15 Robert Hovden , Huolin L. Xin , David A. Muller

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage,…

计算机视觉与模式识别 · 计算机科学 2016-12-06 Suhas Sreehari , S. V. Venkatakrishnan , Katherine L. Bouman , Jeffrey P. Simmons , Lawrence F. Drummy , Charles A. Bouman

High-resolution connectomics data allows for the identification of dysfunctional mitochondria which are linked to a variety of diseases such as autism or bipolar. However, manual analysis is not feasible since datasets can be petabytes in…

计算机视觉与模式识别 · 计算机科学 2020-06-22 Vincent Casser , Kai Kang , Hanspeter Pfister , Daniel Haehn

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

材料科学 · 物理学 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa