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Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

机器学习 · 计算机科学 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

材料科学 · 物理学 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

To ensure energy efficiency and reliable operations, it is essential to monitor solar panels in generation plants to detect defects. It is quite labor-intensive, time consuming and costly to manually monitor large-scale solar plants and…

计算机视觉与模式识别 · 计算机科学 2026-04-14 Muhammad Junaid Asif , Muhammad Saad Rafaqat , Usman Nazakat , Uzair Khan , Rana Fayyaz Ahmad

This paper aims at developing an integrated system of clothing co-parsing, in order to jointly parse a set of clothing images (unsegmented but annotated with tags) into semantic configurations. We propose a data-driven framework consisting…

计算机视觉与模式识别 · 计算机科学 2015-02-04 Wei Yang , Ping Luo , Liang Lin

In a critical software system, the testers have to spend an enormous amount of time and effort to maintain the software due to the continuous occurrence of defects. Among such defects, some severe defects may adversely affect the software.…

软件工程 · 计算机科学 2022-10-11 Umamaheswara Sharma B , Ravichandra Sadam

Leather is a natural and durable material created through a process of tanning of hides and skins of animals. The price of the leather is subjective as it is highly sensitive to its quality and surface defects condition. In the literature,…

计算机视觉与模式识别 · 计算机科学 2019-03-29 Sze-Teng Liong , Y. S. Gan , Yen-Chang Huang , Chang-Ann Yuan , Hsiu-Chi Chang

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

计算机视觉与模式识别 · 计算机科学 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

This paper aims at developing an automatic algorithm for moth recognition from trap images in real-world conditions. This method uses our previous work for detection [1] and introduces an adapted classification step. More precisely, SVM…

计算机视觉与模式识别 · 计算机科学 2018-09-19 Mohamed Chafik Bakkay , Sylvie Chambon , Hatem A. Rashwan , Christian Lubat , Sébastien Barsotti

Owing to the lack of defect samples in industrial product quality inspection, trained segmentation model tends to overfit when applied online. To address this problem, we propose a defect sample simulation algorithm based on neural style…

计算机视觉与模式识别 · 计算机科学 2019-10-09 Taoran Wei , Danhua Cao , Xingru Jiang , Caiyun Zheng , Lizhe Liu

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly…

计算机视觉与模式识别 · 计算机科学 2023-06-21 Simon Thomine , Hichem Snoussi , Mahmoud Soua

We describe a setup for optical quality assurance of silicon microstrip sensors. Pattern recognition algorithms were developed to analyze microscopic scans of the sensors for defects. It is shown that the software has a recognition and…

仪器与探测器 · 物理学 2019-02-20 E. Lavrik , I. Panasenko , H. R. Schmidt

The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and…

计算机视觉与模式识别 · 计算机科学 2023-11-22 Peng Wang , Haiming Yao , Wenyong Yu

Many computer vision problems (e.g., camera calibration, image alignment, structure from motion) are solved with nonlinear optimization methods. It is generally accepted that second order descent methods are the most robust, fast, and…

计算机视觉与模式识别 · 计算机科学 2014-05-06 Xuehan Xiong , Fernando De la Torre

Recently, anomaly detection and localization in multimedia data have received significant attention among the machine learning community. In real-world applications such as medical diagnosis and industrial defect detection, anomalies only…

计算机视觉与模式识别 · 计算机科学 2022-05-16 Chaoqin Huang , Qinwei Xu , Yanfeng Wang , Yu Wang , Ya Zhang

Visual defect detection in industrial glass manufacturing remains a critical challenge due to the low frequency of defective products, leading to imbalanced datasets that limit the performance of deep learning models and computer vision…

计算机视觉与模式识别 · 计算机科学 2025-07-30 Sajjad Rezvani Boroujeni , Hossein Abedi , Tom Bush

In this work, a highly customizable and scalable vision based system for automation of mechanical assembly lines is described. The proposed system calculates the features that are required to classify and identify the different kinds of…

计算机视觉与模式识别 · 计算机科学 2023-10-04 Toshit Jain , Faisel Mushtaq , K Ramesh , Sandip Deshmukh , Tathagata Ray , Chandu Parimi , Praveen Tandon , Pramod Kumar Jha

Discovering novel materials with desired properties is essential for driving innovation. Industry 4.0 and smart manufacturing have promised transformative advances in this area through real-time data integration and automated production…

机器学习 · 计算机科学 2025-04-08 Avijit Saha Asru , Hamed Khosravi , Imtiaz Ahmed , Abdullahil Azeem

In recent years, the advancement of AI technologies has accelerated the development of smart factories. In particular, the automatic monitoring of product assembly progress is crucial for improving operational efficiency, minimizing the…

计算机视觉与模式识别 · 计算机科学 2026-01-05 Kazuma Miura , Sarthak Pathak , Kazunori Umeda

Automatic mammogram classification and mass segmentation play a critical role in a computer-aided mammogram screening system. In this work, we present a unified mammogram analysis framework for both whole-mammogram classification and…

计算机视觉与模式识别 · 计算机科学 2018-09-03 Rongzhao Zhang , Han Zhang , Albert C. S. Chung