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相关论文: Advances in Crystallographic Image Processing for …

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Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning…

材料科学 · 物理学 2020-07-07 Jack C. Straton , Peter Moeck , Bill Moon , Taylor T. Bilyeu

Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…

材料科学 · 物理学 2020-12-16 Peter Moeck

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

仪器与探测器 · 物理学 2021-06-24 Stefan Ernst , Dominik M. Irber , Andreas M. Waeber , Georg Braunbeck , Friedemann Reinhard

Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…

仪器与探测器 · 物理学 2015-05-19 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Quantitative phase imaging (QPI) has been widely applied in characterizing cells and tissues. Spatial light interference microscopy (SLIM) is a highly sensitive QPI method, due to its partially coherent illumination and common path…

图像与视频处理 · 电气工程与系统科学 2024-06-12 Yuheng Jiao , Yuchen R. He , Mikhail E. Kandel , Xiaojun Liu , Wenlong Lu , Gabriel Popescu

Advancements in deep learning have ignited an explosion of research on efficient hardware for embedded computer vision. Hardware vision acceleration, however, does not address the cost of capturing and processing the image data that feeds…

计算机视觉与模式识别 · 计算机科学 2017-08-03 Mark Buckler , Suren Jayasuriya , Adrian Sampson

Single image inverse problem is a notoriously challenging ill-posed problem that aims to restore the original image from one of its corrupted versions. Recently, this field has been immensely influenced by the emergence of deep-learning…

计算机视觉与模式识别 · 计算机科学 2019-11-19 Qianwei Zhou , Chen Zhou , Haigen Hu , Yuhang Chen , Shengyong Chen , Xiaoxin Li

Statistically sound crystallographic symmetry classifications are obtained with information theory based methods in the presence of approximately Gaussian distributed noise. A set of three synthetic patterns with strong Fedorov type…

材料科学 · 物理学 2022-05-03 Peter Moeck

We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…

仪器与探测器 · 物理学 2022-08-29 Maxwell Freeman , Rhett Applestone , Wyatt Behn , Victor Brar

We present an advanced scanning probe microscopy system enhanced with artificial intelligence (AI-SPM) designed for self-driving atomic-scale measurements. This system expertly identifies and manipulates atomic positions with high…

计算物理 · 物理学 2024-04-18 Zhuo Diao , Keiichi Ueda , Linfeng Hou , Fengxuan Li , Hayato Yamashita , Masayuki Abe

Confocal laser scanning microscopy (CLSM) stands out as one of the most widely used microscopy techniques, thanks to its three-dimensional imaging capability and its sub-diffraction spatial resolution, achieved through the closure of a…

Statistically sound crystallographic symmetry classifications are obtained with information theory based methods in the presence of approximately Gaussian distributed noise. A set of three synthetic images with very strong Fedorov type…

图像与视频处理 · 电气工程与系统科学 2023-03-28 Peter Moeck

Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also…

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved…

介观与纳米尺度物理 · 物理学 2017-12-11 Sumit Tewari , Koen M. Bastiaans , Milan P. Allan , Jan M. van Ruitenbeek

We present a novel approach to implement compressive sensing in laser scanning microscopes (LSM), specifically in image scanning microscopy (ISM), using a single-photon avalanche diode (SPAD) array detector. Our method addresses two…

图像与视频处理 · 电气工程与系统科学 2023-07-20 Ajay Gunalan , Marco Castello , Simonluca Piazza , Shunlei Li , Alberto Diaspro , Leonardo S. Mattos , Paolo Bianchini

Correlation plenoptic imaging (CPI) is a scanning-free diffraction-limited 3D optical imaging technique exploiting the peculiar properties of correlated light sources. CPI has been further extended to samples of interest to microscopy, such…

Scanning tunnelling microscopy (STM) enables atomic-resolution imaging and atom manipulation, but its utility is often limited by tip degradation and slow serial data acquisition. Fabrication adds another layer of complexity since the tip…

计算机视觉与模式识别 · 计算机科学 2025-10-31 Nikola L. Kolev , Tommaso Rodani , Neil J. Curson , Taylor J. Z. Stock , Alberto Cazzaniga

For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often atomic scales in ambient, liquid, and vacuum environments. Historically, SPM…

A home made DSP-controlled scanning probe microscope (SPM) system has been developed and its utilization as a tool for lithography on nanometer scale is reported. User-friendly graphic interface allows to directly perform nanolithography…

材料科学 · 物理学 2007-05-23 Pasqualantonio Pingue , Paolo Baschieri , Cesare Ascoli , Michel Dayez

Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a…

仪器与探测器 · 物理学 2024-11-20 Maxime Le Ster , Sławomir Pawłowski , Iaroslav Lutsyk , Paweł Janusz Kowalczyk
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