相关论文: Synchronous, Crosstalk-free Correlative AFM and Co…

We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…

A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…

Intercalation of two dimensional materials, particularly transition metal dichalcogenides, is a noninvasive way to modify electronic, optical and structural properties of these materials. However, research of these atomic-scale phenomena…

This paper concerns an inverse problem for fluorescence diffuse optical tomography (FDOT) reconstructing locations of multiple point targets from the measured temporal response functions. The targets are multiple fluorescent point objects…

Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…

In the 1970s a new paradigm was introduced that interacting quenched systems, such as a spin-glass, have a phase transition in which long time memory of spatial patterns is realized without spatial correlations. The principal methods to…

(The systematics of photon absorption cross sections in nuclei and small metal particles are examined as a function of the number of constituent fermions $A$. It is pointed out that the shell-structure-linked oscillations in the full width…

We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…

Nanosecond temporal resolution enables new methods for wide-field imaging like time-of-flight, gated detection, and fluorescence lifetime. The optical efficiency of existing approaches, however, presents challenges for low-light…

We propose to enhance the performance of localized plasmon structured illumination microscopy (LP-SIM) via intensity correlations. LP-SIM uses sub-wavelength illumination patterns to encode high spatial frequency information. It can enhance…

The combination of single photon emitters (quantum dots) and tailored metal nanoparticles with defined size and shape allows a detailed study of the interaction between light and matter. The enhanced optical near-field of the nanoparticles…

We discuss experimental studies of the interaction between a nanoscopic object and a photonic crystal membrane resonator of quality factor Q=55000. By controlled actuation of a glass fiber tip in the near-field of a photonic crystal, we…

We study the phase diagram of an elastic interaction model for spin crossover (SC) materials with antiferromagnetic-like short-range interactions. In this model, the interplay between the short-range interaction and the long-range…

A discrete-time end-to-end fiber-optical channel model is derived based on the first-order perturbation approach. The model relates the discrete-time input symbol sequences of co-propagating wavelength channels to the received symbol…

In studies of the visual system as well as in computer vision, the focus is often on contrast edges. However, the primate visual system contains a large number of cells that are insensitive to spatial contrast and, instead, respond to…

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…

Electron microscopy based on high-energy electrons allows nanoscopic analytical imaging taking advantage of secondarily generated particles. Especially for cathodoluminescence, the correlation between primary incident electrons and emitted…

Atomically thin transition metal dichalcogenides (TMDs) hold promising potential for applications in optoelectronics. Due to their direct band gap and the extraordinarily strong Coulomb interaction, TMDs exhibit efficient light-matter…