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相关论文: Near-field imaging beyond the probe aperture limit

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I present a direct and intuitive eigenmode method that evaluates the near-field enhancement around the surface of metallic nanoparticles of arbitrary shape. The method is based on the boundary integral equation in the electrostatic limit.…

介观与纳米尺度物理 · 物理学 2013-05-30 Titus Sandu

In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…

光学 · 物理学 2013-09-03 Yu. V. Miklyaev , S. A. Asselborn , K. A. Zaytsev , M. Ya. Darscht

We theoretically and experimentally demonstrate a multifrequency excitation and detection scheme in apertureless near field optical microscopy, that exceeds current state of the art sensitivity and background suppression. By exciting the…

光学 · 物理学 2018-01-30 H. Greener , M. Mrejen , U. Arieli , H. Suchowski

The near-field scanning optical microscopic (NSOM) imaging of Au nanoparticles with size in the sub-wavelength limit (<wavelength/2N.A.) is reported. The NSOM imaging technique can resolve the objects which is beyond the scope of optical…

材料科学 · 物理学 2017-05-23 Prajit Dhara , A. K. Sivadasan

Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…

A theoretical approach to determine the optimal form of the near-field optical microscope probe is proposed. An analytical expression of the optimal probe form with subwavelength aperture has been obtained. The advantages of the probe with…

光学 · 物理学 2009-11-11 N. M. Arslanov

Spatial effects of interference and interaction of light modes in the subwavelength part of the near-field optical microscopy probe have been theoretically studied. It was found that the mode interference can lead to higher spatial…

光学 · 物理学 2007-05-23 N. M. Arslanov , S. A. Moiseev

Apertureless scanning near-field optical microscopy (a-SNOM) is typically limited to ~10 nm resolution by the tip apex size. We demonstrate that ~1-nm resolution can be achieved under continuous-wave (CW) illumination by exploiting Fano…

Here we report nonlinear focal modulation microscopy (NFOMM) to achieve super-resolution imaging. Abandoning the previous persistence on minimizing the size of Gaussian emission pattern by directly narrowing (e.g. Minimizing the detection…

Essentially, the idea of improving the resolution of a given imaging system is to enhance its information capacity represented usually by the temporal-bandwidth (or, spatial-spectrum) product. This letter introduces the concept of…

光学 · 物理学 2014-03-21 Lianlin Li , Fang Li , Tiejun Cui

The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern super-resolution microscopy techniques employ active interaction with the object by exploiting its optical…

光学 · 物理学 2022-01-05 A. A. Pushkina , G. Maltese , J. I. Costa-Filho , P. Patel , A. I. Lvovsky

Near-field scanning optical microscopy is a powerful technique for imaging below the diffraction limit, which has been extensively used in bio-medical imaging and nanophotonics. However, when the electromagnetic fields under measurement are…

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

仪器与探测器 · 物理学 2021-06-24 Stefan Ernst , Dominik M. Irber , Andreas M. Waeber , Georg Braunbeck , Friedemann Reinhard

An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…

介观与纳米尺度物理 · 物理学 2019-12-10 Ramazan Sahin , Mehmet Gunay , Alpan Bek , Mehmet Emre Tasgin

Circular aperture probes have been successfully used for high-resolution near-field microwave imaging. It has been established that circular aperture probes could conceivably provide higher image fidelity compared to rectangular aperture…

系统与控制 · 电气工程与系统科学 2022-12-13 Zubair Akhter , MS Rahman , M Aboukhousa

Confining light to sharp metal tips has become a versatile technique to study optical and electronic properties far below the diffraction limit. Particularly near-field microscopy in the mid-infrared spectral range has found a variety of…

Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…

量子物理 · 物理学 2024-03-22 Soheil Khajavi , Zahra Shaterzadeh-Yazdi , Ali Eghrari , Mohammad Neshat

Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…

The near field scanning optical microscopy (NSOM) is not only a tool for imaging of objects in the sub wavelength limit but also a prominent characteristic tool for understanding the intrinsic properties of the nanostructures. The effect of…

材料科学 · 物理学 2017-05-16 A. K. Sivadasan , Kishore K. Madapu , Prajit Dhara

We discuss theoretically the concept of spatial resolution in near-field scanning optical microscopy (NSOM) in light of a recent work [Opt. Express 17 (2009) 19969] which reported on the achievement of active tips made of a single…

量子物理 · 物理学 2015-06-18 A. Drezet , A. Cuche , S. Huant
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