相关论文: Intermodulation spectroscopy as an alternative to …
The sensitivity of an interferometer depends on its readout scheme. However, little attention has been paid to the readout schemes of atom interferometers from the viewpoint of their sensitivity. The difference in sensitivity between…
We theoretically and experimentally demonstrate a multifrequency excitation and detection scheme in apertureless near field optical microscopy, that exceeds current state of the art sensitivity and background suppression. By exciting the…
Femtosecond spectroscopy is an important tool for tracking rapid photoinduced processes in a variety of materials. To spatially map the processes in a sample would substantially expand the capabilities of the method. This is, however,…
We present a detailed analysis of an application of frequency modulation (FM) spectroscopy in the high modulation depth limit. We have recently completed and reported a measurement of the Stark shift in the indium $5p_{1/2}\rightarrow…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
Time-resolved near-infrared absorption spectroscopy of single non-repeatable transient events is performed at high spectral resolution with a dual-comb interferometer using a continuous-wave laser followed by a single electro-optic…
Time-resolved scanning near-field optical microscopy (tr-SNOM) enables the measurement of the dynamic optical response of functional surfaces beyond the diffraction limit. Experimental challenges are imposed both by the use of a pulsed…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force…
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…
Atom interferometers offer excellent sensitivity to gravitational and inertial signals but have limited dynamic range. We introduce a scheme that improves on this trade-off by a factor of 50 using composite fringes, obtained from sets of…
We present an electrically tunable terahertz two dimensional plasmonic interferometer with an integrated detection element that down converts the terahertz fields to a DC signal. The integrated detector utilizes a resonant plasmonic…
In order to increase the measured phase of an atom interferometer and improve its sensitivity, researchers attempt to increase the enclosed space-time area using two methods: creating larger separations between the interferometer arms and…
We report on time-resolved optical and terahertz ultrafast spectroscopy of charge-carrier dynamics in the room-temperature antiferromagnetic semiconductor $\alpha $-MnTe. By optically pumping the system with 1.55 eV photons at room…
The mechanical properties of PC12 living cells have been studied at the nanoscale with a Force Feedback Microscope using two experimental approaches. Firstly, the local mechanical impedance of the cell membrane has been mapped…
Time-resolved measurements of quantum dynamics are based on the availability of controlled events (e.g. pump and probe pulses) that are shorter in duration than the typical evolution time scale of the dynamical processes to be observed.…
Since the inception of the atomic force microscope AFM, dynamic methods have been very fruitful by establishing methods to quantify dissipative and conservative forces in the nanoscale and by providing a means to apply gentle forces to the…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…