相关论文: Advanced Kelvin Probe Operational Methodology for …

The scanning Kelvin probe is a tool that allows for the contactless evaluation of contact potential differences in a range of materials, permitting the indirect determination of surface properties such as work function or Fermi levels. In…

Kelvin probe microscopy (KPFM) is a well-established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena. In its conventional form, KPFM…

We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without hardware changes. The resulting setup allows flexible in situ contacting of samples…

Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also…

I present a general scheme through which the evidence of a superposition involving distinct classical-like states of a macroscopic system can be probed. The scheme relies on a qubit being coupled to a macroscopic harmonic oscillator in such…

The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…

We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…

Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the…

We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it…

Deep cosmic microwave background polarization experiments allow a very precise internal reconstruction of the gravitational lensing signal in pricinple. For this aim, likelihood-based or Bayesian methods are typically necessary, where very…

Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work function, topology, surface charge density, or combinations…

Imaging mechanisms in contact Kelvin Probe Force Microscopy (cKPFM) are explored via information theory-based methods. Gaussian Processes are used to achieve super-resolution in the cKPFM signal, effectively extrapolating across the spatial…

We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm above the samplewith the help of Scanning Tunneling Microscope…

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

Using the recursive Green's function technique, we study the coherent electron conductance of a quantum point contact in the presence of a scanning probe microscope tip. Images of the coherent fringe inside a quantum point contact for…

In this Letter we suggest a new method of manipulating individual molecules with scanning probes using a "pick-up-and put-down" mode. We demonstrate that the number of molecules picked up by the tip and deposited in a different location can…

Experiments that measure extremely small gravitational forces are often hampered by the presence of non-gravitational forces that can neither be calculated nor separately measured. Among these spurious forces is electrostatic attraction…

We consider conductance mapping of systems based on the two-dimensional electron gas with scanning gate microscopy using two and more tips of the atomic force microscope. The paper contains results of numerical simulations for a model tip…

Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to…

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air,…