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相关论文: Frequency dependent visco-elastic properties of a …

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We report the observation of a transition in the dynamical properties of water nano-menicus which dramatically change when probed at different time scales. Using a AFM mode that we name Force Feedback Microscopy, we observe this change in…

Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…

应用物理 · 物理学 2025-06-18 Kenichi Umeda , Karen Kamoshita , Noriyuki Kodera

The sensitivity of mechanical resonators to physical quantities such as acceleration, pressure, mass and temperature enables them to underpin sensing and metrology applications. Here, we observe that the resonance frequency of a…

应用物理 · 物理学 2025-09-15 Toji Thomas , Kevin F. MacDonald , Eric Plum

Dynamical response of nanomechanical cantilever structures immersed in a viscous fluid is important to in vitro single-molecule force spectroscopy, biomolecular recognition of disease-specific proteins, and the detection of microscopic…

其他凝聚态物理 · 物理学 2009-11-11 Jerome Dorignac , Agnieszka Kalinowski , Shyamsunder Erramilli , Pritiraj Mohanty

High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…

介观与纳米尺度物理 · 物理学 2014-03-11 C. Doolin , P. H. Kim , B. D. Hauer , A. J. R MacDonald , J. P Davis

We measure the mechanical thermal noise of soft silicon atomic force microscopy cantilevers. Using an interferometric setup, we have a resolution down to 1E-14 m/rtHz on a wide spectral range (3 Hz to 1E5 Hz). The low frequency behavior…

材料科学 · 物理学 2009-09-25 Pierdomenico Paolino , Ludovic Bellon

Atomic force microscopy cantilevers are often, intentionally or not, heated at their extremity. We describe a model to compute the resulting temperature field in the cantilever and in the surrounding fluid on a wide temperature range. In…

统计力学 · 物理学 2021-10-08 Basile Pottier , Ludovic Bellon

Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…

仪器与探测器 · 物理学 2015-05-14 Sebastian Hoof , Nitya Nand Gosvami , Bart W. Hoogenboom

Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…

生物物理 · 物理学 2014-05-01 Luca Costa , Mario S Rodrigues , Emily Newman , Chloe Zubieta , Joel Chevrier , Fabio Comin

Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…

应用物理 · 物理学 2026-01-16 Kenichi Umeda , Noriyuki Kodera

Here we obtain analytical expressions for the frequency response of a cantilever beam in the presence of ambient fluid. The advantage of our approach, besides its simplicity of use, is that it explicitly contains the viscosity and the…

仪器与探测器 · 物理学 2016-08-22 C. Metzger , J. Rodriguez , F. Zypman

The quantitative measurement of viscoelasticity of nano-scaleentities is an important goal of nanotechnology research and there is considerable progress with advent of dynamic Atomic Force Microscopy. The hydrodynamics of cantilever, the…

We investigate the shape and mechanical properties of liquid interfaces down to nanometer scale by atomic force microscopy (AFM) and scanning electron microscopy (SEM) combined with in situ micromanipulation techniques. In both cases, the…

Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…

材料科学 · 物理学 2015-06-25 Stephen Jesse , Arthur P. Baddorf , Sergei V. Kalinin

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

介观与纳米尺度物理 · 物理学 2017-02-01 Nina Balke , Stephen Jesse , Ben Carmichael , M. Baris Okatan , Ivan I. Kravchenko , Sergei V. Kalinin , Alexander Tselev

The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some…

介观与纳米尺度物理 · 物理学 2013-05-09 Justine Laurent , Audrey Steinberger , Ludovic Bellon

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

光学 · 物理学 2015-06-05 Yuxiang Liu , Houxun Miao , Vladimir Aksyuk , Kartik Srinivasan

Here we apply nanomechanical resonators to the study of oscillatory fluid dynamics. A high-resonance-frequency nanomechanical resonator generates a rapidly oscillating flow in a surrounding gaseous environment; the nature of the flow is…

其他凝聚态物理 · 物理学 2009-11-13 D. M. Karabacak , V. Yakhot , K. L. Ekinci

We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…

介观与纳米尺度物理 · 物理学 2022-02-16 Gennady P. Berman , Vladimir I. Tsifrinovich

In optical detection setups to measure the deflection of micro-cantilevers, part of the sensing light is absorbed, heating the mechanical probe. We present experimental evidences of a frequency shift of the resonant modes of a cantilever…

仪器与探测器 · 物理学 2015-06-23 Felipe Aguilar Sandoval , Mickael Geitner , Éric Bertin , Ludovic Bellon
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