相关论文: Near-field to far-field characterization of speckl…
We study theoretically the spatial correlations between the intensities measured at the input and output planes of a disordered scattering medium. We show that at large optical thicknesses, a long-range spatial correlation persists and…
Elastic light scattering has been extensively used to study samples showing a non uniform refraction index on lengthscales from a fraction of a micrometer to a fraction of a millimeter. Typically, a wide laser beam is sent through the…
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase…
We show that intensity of a wave created by a source embedded inside a three-dimensional disordered medium exhibits a non-universal space-time correlation which depends explicitly on the short-distance properties of disorder, source size,…
Speckle is maybe the most fundamental interference effect of light in disordered media, giving rise to fascinating physical phenomena and enabling applications in imaging, spectroscopy or cryptography, to name a few. While speckle formed…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
Modern scattering-type scanning near-field optical microscopy (s-SNOM) has become an indispensable tool in material research. However, as the s-SNOM technique marches into the far-infrared (IR) and terahertz (THz) regimes, emerging…
We consider the propagation of several entangled photons through an elastically scattering medium and study statistical properties of their speckle patterns. We find the spatial correlations of multiphoton speckles and their sensitivity to…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…
Understanding light-matter interaction in disordered photonic media allows people to manipulate light scattering and achieve exciting applications using seemingly scrambled media. As the concentration of scattering particles rises, they are…
A point source in a disordered scattering medium generates a speckle pattern with non-universal features, giving rise to the so-called C_0 correlation. We analyze theoretically the relationship between the C_0 correlation and the…
In this paper we analyze an imaging technique based on intensity speckle correlations over incident field position proposed in [J. A. Newmann and K. J. Webb, Phys. Rev. Lett. 113, 263903 (2014)]. Its purpose is to reconstruct a field…
Scattering-type scanning near-field optical microscope (s-SNOM) has become an essential tool to study polaritons - quasiparticles of light coupled to collective charge oscillations - via direct probing of their near field with a spatial…
We describe an optical technique based on the statistical analysis of the random intensity distribution due to the interference of the near-field scattered light with the strong transmitted beam. It is shown that, from the study of the…
We propose a general theoretical scheme for the investigation of light emitted from nano- and micrometric structures of arbitrary shape and composition. More specifically, the proposed fully three-dimensional approach allows to derive the…
The scattering-type Scanning Near-Field Optical Microscope (s-SNOM) is acknowledged as an excellent tool to investigate the optical properties of different materials and biological samples at the nanoscale. In this study we show that s-SNOM…
We study the spatio-temporal pattern of the near-field intensity correlations generated by parametric scattering processes in a planar optical cavity. A generalized Bogolubov-de Gennes model is used to compute the second order field…
Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique for extreme subwavelength imaging and spectroscopy, with around 20 nm spatial resolution. But quantitative relationships between experiment and material…
We have implemented the newly-introduced, coherence-based technique of x-ray near-field speckle (XNFS) at 8-ID-I at the Advanced Photon Source. In the near field regime of high-brilliance synchrotron x-rays scattered from a sample of…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…