中文
相关论文

相关论文: Simple and reliable method of conductive SPM probe…

200 篇论文

Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions. Applicability of SSPM and related electrostatic scanning probe microscopies for…

介观与纳米尺度物理 · 物理学 2009-11-07 Sergei V. Kalinin , Marcus Freitag , A. T. Johnson , Dawn A. Bonnell

Scanning probe imaging and manipulation of matter is of crucial importance for nanoscale science and technology. However, its resolution and ability to manipulate matter at the atomic scale is limited by rather poor control over the fine…

介观与纳米尺度物理 · 物理学 2015-03-17 Vasilii I. Artyukhov

Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto conductive atomic force microscopy (AFM) probes with the help of dielectrophoresis (DEP). This process involved the application of a 10 V, 2 MHz, AC bias between a…

Scanning tunneling microscopy (STM) gives us the opportunity to map the surface of functionalized carbon nanotubes in an energy resolved manner and with atomic precision. But this potential is largely untapped, mainly due to sample…

介观与纳米尺度物理 · 物理学 2011-02-28 P. Nemes-Incze , Z. Kónya , I. Kiricsi , Á. Pekker , Z. E. Horváth , K. Kamarás , L. P. Biró

A gated probe for scanning tunnelling microscopy (STM) has been developed. The probe extends normal STM operations by means of an additional electrode fabricated next to the tunnelling tip. The extra electrode does not make contact with the…

介观与纳米尺度物理 · 物理学 2009-10-31 L. Gurevich , L. Canali , L. P. Kouwenhoven

A fabrication method for positioning and embedding a single-walled carbon nanotube (SWNT) across the diameter of a solid state nanopore is presented. Chemical vapor deposition (CVD) is used to grow SWNTs over arrays of focused ion beam…

生物物理 · 物理学 2013-08-07 E. S. Sadki , S. Garaj , D. Vlassarev , J. A. Golovchenko , D. Branton

Using carbon nanotubes (CNTs) produced by chemical vapor deposition, we have explored different strategies for the preparation of carbon nanotube devices suited for electrical and mechanical measurements. Though the target device is a…

介观与纳米尺度物理 · 物理学 2009-11-10 B. Babic , J. Furer , M. Iqbal , C. Schonenberger

A home made DSP-controlled scanning probe microscope (SPM) system has been developed and its utilization as a tool for lithography on nanometer scale is reported. User-friendly graphic interface allows to directly perform nanolithography…

材料科学 · 物理学 2007-05-23 Pasqualantonio Pingue , Paolo Baschieri , Cesare Ascoli , Michel Dayez

Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to continuously develop metrology methods in the field of nanotechnology. Contact and interface properties are key parameters that determine the…

介观与纳米尺度物理 · 物理学 2012-01-23 Julien Buchoux , Ludovic Bellon , Sophie Marsaudon , Jean-Pierre Aimé

We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled…

介观与纳米尺度物理 · 物理学 2009-10-31 A. Bachtold , M. S. Fuhrer , S. Plyasunov , M. Forero , Erik H. Anderson , A. Zettl , Paul L. McEuen

This paper the utilizes atomistic-continuum mechanics (ACM) to investigate the mechanical properties of single-walled carbon nanotubes (SWCNTs). By establishing a linkage between structural mechanics and molecular mechanics, not only the…

材料科学 · 物理学 2007-08-13 C. -J. Wu , C. -Y. Chou , C. -N. Han , K. -N. Chiang

Insulated cantilever probes with a high aspect ratio conducting apex have been fabricated and their dynamic and electrical properties analyzed. The cantilevers were coated with silicon dioxide and a via was fabricated through the oxide at…

材料科学 · 物理学 2008-03-13 B. J. Rodriguez , S. Jesse , K. Seal , A. P. Baddorf , S. V. Kalinin , P. Rack

We use conducting-tip atomic force microscopy (AFM) to measure local electronic properties of single wall carbon nanotube (SWNT) circuits on insulating substrates. When a voltage is applied to the tip and AFM feedback is used to position…

介观与纳米尺度物理 · 物理学 2016-08-15 M. Freitag , M. Radosavljević , W. Clauss , A. T. Johnson

We report a process to fabricate carbon nanotubes (CNT) by chemical vapor deposition at predetermined location. This process was enabled by patterning catalyst nanoparticles directly on silicon substrates with nanometer-scale precision…

We demonstrate a simple capacitive based method to quickly and efficiently locate micron size conductive samples on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition the method is designed to locate…

介观与纳米尺度物理 · 物理学 2014-02-04 Guohong Li , Adina Luican , Eva Y. Andrei

This paper presents the design and fabrication of batch-processed cantilever probes with electrical shielding for scanning microwave impedance microscopy. The diameter of the tip apex, which defines the electrical resolution, is less than…

Controlled atomic scale fabrication of functional devices is one of the holy grails of nanotechnology. The most promising class of techniques that enable deterministic nanodevice fabrication are based on scanning probe patterning or surface…

The work here has demonstrated the use a simple microwave plasma process for welding carbon nanotubes onto solid surfaces such as plastics and glasses, it was found that due to the lower softening point and viscosity of polystyrene…

材料科学 · 物理学 2015-12-02 Pejman Talemi , George Simon

Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto a variety of conductive scanning probes including atomic force microscope (AFM) tips and scanning tunnelling microscope (STM) needles using positive dielectrophoresis (DEP).…

材料科学 · 物理学 2011-06-21 Haoyan Wei , Anna Craig , Bryan D Huey , Fotios Papadimitrakopoulos , Harris Marcus
‹ 上一页 1 2 3 10 下一页 ›