相关论文: Gafchromic EBT2 film dosimetry in reflection mode …

Purpose : To relate the physical transmittance parameters of the water equivalent Gafchromic EBT 2 Film with the delivered dose in a transparent absolute calibration protocol. The protocol should be easy to understand, easy to perform, and…

We propose a methodology to perform dose measurements using gafchromic films which can span several decades of dose levels. The technique is based on a rescaling approach using different films irradiated at different dose levels. This is…

The purpose of this study was to find the most accurate model for radiochromic film dosimetry by comparing different channel independent perturbation models. A model selection approach based on (algorithmic) information theory was followed,…

This work investigates the dose-response curves of GAFCHROMIC EBT, EBT2, and EBT3 radiochromic films using synchrotron-produced monochromatic x-ray beams. EBT2 film is being utilized for dose verification in photoactivated Auger electron…

We experimentally demonstrate a very large dynamic optical reflection modulation from a simple unpatterned layered stack of phase-change materials ultrathin films. Specifically, we theoretically and experimentally demonstrate that properly…

The main objective of multichannel radiochromic film dosimetry methods is to correct, or at least mitigate, spatial heterogeneities in the film-scanner response, especially variations in the active layer thickness. To this end, films can…

It is important to study absorption spectrum in film dosimetry because the spectral absorbance of the film relates to the film's total absorption dose. We investigated the absorption spectra of Gafchromic EBT2 film with various rotational…

The purpose of our study is to develop a new, 3-dimensional dosimetry system to verify the accuracy of dose deliveries in Leksell Gamma Knife-Perfexion TM (LGKP) (Elekta, Norcross, GA, USA). The instrument consists of a moving head phantom,…

Multispectral imaging coupled with Artificial Intelligence, Machine Learning and Signal Processing techniques work as a feasible alternative for laboratory testing, especially in food quality control. Most of the recent related research has…

Diffraction tomography (DT) has been widely explored in transmission-mode configurations, enabling high-resolution, label-free 3D imaging. However, industrial metrology applications, such as semiconductor inspection, typically involve…

Radiochromic films (RCFs) offer valuable two-dimensional dosimetry capabilities with a conceptually simple operating principle that requires minimal investment, making them particularly suitable for very high energy electron (VHEE) FLASH…

There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback or can be used without access to the distal side of the scatterer. Among all the wave-front shaping techniques, retrieving…

Reflection measurements give access to the complex impedance of a material on a wide frequency range. This is of interest to study the dynamical properties of various materials, for instance disordered superconductors. However reflection…

Ptychographic extreme ultraviolet (EUV) diffractive imaging has emerged as a promising candidate for the next-generation metrology solutions in the semiconductor industry, as it can image wafer samples in reflection geometry at the…

Combined frequency-resolved techniques are suitable to study electrochromic (EC) materials. We present an experimental setup for simultaneous electrochemical and color impedance studies of EC systems in transmission mode and estimate its…

Which systems are ideal to obtain negative refraction with no absorption? Electromagnetically induced transparency (EIT) is a method to suppress absorption and make a material transparent to a field of a given frequency. Such a system has…

We have developed a conceptually new type of ellipsometry which allows the determination of the complex refractive index by simultaneously measuring the unpolarized normal-incidence reflectivity relative to the vacuum and to another…

In this paper, we propose a technique named reflection F-scan or RF-scan, that can be used to measure the nonlinear-refractive index n_2 of thin-film semiconductors. In this technique, a p-polarized Gaussian beam is focused using an…

A method for the electrically controlled synchronous mode tuning in the transmittance and reflectance spectra of a photonic structure consisting of an asymmetric dielectric Fabry-Perot microcavity and an ultrathin metallic film has been…

In this article, a new method is discussed for the calibration and monitoring of photomultiplier tubes (PMTs). This method is based on a Discrete Fourier Transform (DFT) and it is fast and general so that it can be used in cases where an…