中文
相关论文

相关论文: Carbon-fiber tips for scanning probe microscopes a…

200 篇论文

For a successful point-contact spectroscopy (PCS) measurement, metallic tips of proper shape and smoothness are essential to ensure the ballistic nature of a point-contact junction. Until recently, the fabrication of Au tips suitable for…

仪器与探测器 · 物理学 2015-05-04 S. Narasiwodeyar , M. Dwyer , M. Liu , W. K. Park , L. H. Greene

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…

介观与纳米尺度物理 · 物理学 2009-11-13 A. E. Gildemeister , T. Ihn , M. Sigrist , K. Ensslin , D. C. Driscoll , A. C. Gossard

We report on conductance measurements in carbon nanotube based double quantum dots connected to two normal electrodes and a central superconducting finger. By operating our devices as beam splitters, we provide evidence for Crossed Andreev…

介观与纳米尺度物理 · 物理学 2015-05-14 L. G. Herrmann , F. Portier , P. Roche , A. Levy Yeyati , T. Kontos , C. Strunk

We use parametrized linear combination of atomic orbitals calculations to determine the stability, optimum geometry and electronic properties of nanometer-sized capped graphitic cones, called ``nano-horns''. Different nano-horn morphologies…

材料科学 · 物理学 2009-10-31 Savas Berber , Young-Kyun Kwon , David Tomanek

The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most…

Insulated cantilever probes with a high aspect ratio conducting apex have been fabricated and their dynamic and electrical properties analyzed. The cantilevers were coated with silicon dioxide and a via was fabricated through the oxide at…

材料科学 · 物理学 2008-03-13 B. J. Rodriguez , S. Jesse , K. Seal , A. P. Baddorf , S. V. Kalinin , P. Rack

The optical transmission and reflection in between two metalized optical fiber tips is studied in the optical near-field and far-field domains. Besides aluminum-coated tips for near-field scanning optical microscopy (NSOM), specifically…

In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of 90% Co after exposure to…

介观与纳米尺度物理 · 物理学 2017-09-19 Markus Stiller , Jose Barzola-Quiquia , Pablo D. Esquinazi , Soraya Sangiao , Jose M. De Teresa , Jan Meijer , Bernd Abel

A new kind of three-dimensional carbon allotropes, termed carbon honeycomb (CHC), has recently been synthesized [PRL 116, 055501 (2016)]. Based on the experimental results, a family of graphene networks are constructed, and their electronic…

材料科学 · 物理学 2016-07-20 Yan Gao , Yuanping Chen , Chengyong Zhong , Zhongwei Zhang , Yuee Xie , Shengbai Zhang

We show that transport in low-dimensional carbon structures with finite concentrations of scatterers can be modeled by utilising scaling theory and effective cross sections. Our reults are based on large scale numerical simulations of…

介观与纳米尺度物理 · 物理学 2012-01-06 Andreas Uppstu , Karri Saloriutta , Ari Harju , Martti Puska , Antti-Pekka Jauho

Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto a variety of conductive scanning probes including atomic force microscope (AFM) tips and scanning tunnelling microscope (STM) needles using positive dielectrophoresis (DEP).…

材料科学 · 物理学 2011-06-21 Haoyan Wei , Anna Craig , Bryan D Huey , Fotios Papadimitrakopoulos , Harris Marcus

The revised Chen's derivative rule for electron tunneling is implemented to enable computationally efficient first-principles-based calculations of the differential conductance dI/dV for scanning tunneling spectroscopy (STS) simulations.…

材料科学 · 物理学 2025-07-01 Ivan Abilio , Krisztián Palotás

A procedure to characterize the electrical and mechanical properties of micro-fibers is presented here. As the required equipment can be found in many teaching laboratories, it can be carried out by physics and mechanical/electrical…

物理教育 · 物理学 2013-10-24 Andres Castellanos-Gomez

We study local oxidation induced by dynamic atomic force microscopy (AFM), commonly called TappingMode AFM. This minimizes the field induced forces, which cause the tip to blunt, and enables us to use very fine tips. We are able to…

介观与纳米尺度物理 · 物理学 2007-05-23 B. Irmer , M. Kehrle , H. Lorenz , J. P. Kotthaus

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

We demonstrate that due to their spin-orbit interaction carbon nanotube cross-junctions have attractive spin projective properties for transport. First, we show that the junction can be used as a versatile spin filter as a function of a…

介观与纳米尺度物理 · 物理学 2013-11-12 Francesco Mazza , Bernd Braunecker , Patrik Recher , Alfredo Levy Yeyati

A normal metal - superconductor hybrid single-electron trap with tunable barrier is utilized as a tool for spectrum analysis at the extremely low signal levels, using only well filtered cryogenic microwave background as a photon source in…

超导电性 · 物理学 2017-04-26 J. S. Lehtinen , E. Mykkänen , A. Kemppinen , D. Golubev , S. V. Lotkhov , A. J. Manninen

We report the details of construction and testing of a Quantum Twisting Microscope, a recently developed scanning probe instrument that enables twist angle dependent electronic measurements on layered materials. Our implementation is based…

介观与纳米尺度物理 · 物理学 2026-04-07 Sayanwita Biswas , Ranjani Ramachandran , Patrick Irvin , Jeremy Levy

The scanning metallic tip of a scanning force microscope was coupled capacitively to electrons confined in a lithographically defined gate-tunable quantum dot at a temperature of 300 mK. Single electrons were made to hop on or off the dot…

介观与纳米尺度物理 · 物理学 2009-11-10 A. Pioda , S. Kicin , T. Ihn , M. Sigrist , A. Fuhrer , K. Ensslin , A. Weichselbaum , S. E. Ulloa , M. Reinwald , W. Wegscheider

By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…