相关论文: Techniques for Fast Transient Fault Grading Based …

Graphics processing units (GPUs) are gaining widespread use in computational chemistry and other scientific simulation contexts because of their huge performance advantages relative to conventional CPUs. However, the reliability of GPUs in…

Embedded RAM blocks (BRAMs) in field programmable gate arrays (FPGAs) are susceptible to single event effects (SEEs) induced by environmental factors such as cosmic rays, heavy ions, alpha particles and so on. As technology scales, the…

Electromagnetic fault injection (EMFI) is a well known technique used to disturb the behaviour of a chip for weakening its security. These attacks are mostly done on simple microcontrollers. On these targets, the fault effects are…

Smaller feature size, higher clock frequency and lower power consumption are of core concerns of today's nano-technology, which has been resulted by continuous downscaling of CMOS technologies. The resultant 'device shrinking' reduces the…

Homogenization is a fundamental technique for estimating the macroscopic properties of materials with microscale heterogeneity. Among Homogenization methods, the FFT-based Homogenization algorithm has become widely used due to its…

Nowadays, the extensive exploitation of Deep Neural Networks (DNNs) in safety-critical applications raises new reliability concerns. In practice, methods for fault injection by emulation in hardware are efficient and widely used to study…

The emergence of latency-critical AI applications has been supported by the evolution of the edge computing paradigm. However, edge solutions are typically resource-constrained, posing reliability challenges due to heightened contention for…

Designing integrated circuits in radiation environments such as the High Luminosity LHC (HL-LHC) is challenging. Integrated circuits will be exposed to radiation-induced Single Event Effects (SEE). In deep sub-micron technology devices, the…

Transformers and large language models (LLMs), powered by the attention mechanism, have transformed numerous AI applications, driving the need for specialized hardware accelerators. A major challenge in these accelerators is efficiently…

As integrated circuit technologies continue to scale toward advanced process nodes, the continual reduction in node capacitance and supply voltage has made digital systems increasingly vulnerable to soft errors. Although traditional…

We propose a symbolic execution method for analyzing the safety of software under fault attacks both accurately and efficiently. Fault attacks leverage physically injected hardware faults in an embedded system to break the safety of a…

As the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan designs can no longer be verified in RTL simulation unless partitioned into smaller sub-blocks. This paper proposes a methodology to…

Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported.

Transformer models rely on High-Performance Computing (HPC) resources for inference, where soft errors are inevitable in large-scale systems, making the reliability of the model particularly critical. Existing fault tolerance frameworks for…

Neural Networks are currently one of the most widely deployed machine learning algorithms. In particular, Convolutional Neural Networks (CNNs), are gaining popularity and are evaluated for deployment in safety critical applications such as…

A simple physical model for calculation of the ion-induced soft error rate in space environment has been proposed, based on the phenomenological cross section notion. Proposed numerical procedure is adapted to the multiple cell upset…

The growing complexity of safety-relevant systems causes an increasing effort for safety assurance. The reduction of development costs and time-to-market, while guaranteeing safe operation, is therefore a major challenge. In order to enable…

Field-programmable gate arrays (FPGAs) are widely used to implement deep learning inference. Standard deep neural network inference involves the computation of interleaved linear maps and nonlinear activation functions. Prior work for…

As more the communications and signal process we use in the today life the more we intend to develop more reliable devices which gives fewer errors due to transient fault, So we use a technique called 5-modular redundancy to generate fewer…

Soft sensors are crucial in bridging autonomous systems' physical and digital realms, enhancing sensor fusion and perception. Instead of deploying soft sensors on the Cloud, this study shift towards employing on-device soft sensors,…