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Increasing system-on-chip (SoC) heterogeneity, deep hardware/software integration, and the proliferation of third-party intellectual property (IP) have brought security validation to the forefront of semiconductor design. While simulation…

Feature embedding-based methods have shown exceptional performance in detecting industrial anomalies by comparing features of target images with normal images. However, some methods do not meet the speed requirements of real-time inference,…

The most common cause of transmission failure in Wireless High Performance (WirelessHP) target industry environments is impulse interference. As interleavers are commonly used to improve the reliability on the Orthogonal Frequency Division…

Heterogeneous systems appear as a viable design alternative for the dark silicon era. In this paradigm, a processor chip includes several different technological alternatives for implementing a certain logical block (e.g., core, on-chip…

We demonstrate the use of Adaptive Stress Testing to detect and address potential vulnerabilities in a financial environment. We develop a simplified model for credit card fraud detection that utilizes a linear regression classifier based…

Dynamic voltage and frequency scaling (DVFS) and task-to-core allocation are critical for thermal management and balancing energy and performance in embedded systems. Existing approaches either rely on utilization-based heuristics that…

Fault tolerance is a key factor of industrial computing systems design. But in practical terms, these systems, like every commercial product, are under great financial constraints and they have to remain in operational state as long as…

Applications of reversible circuits can be found in the fields of low-power computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for low-power…

This paper summarizes our work on experimentally analyzing, exploiting, and addressing vulnerabilities in multi-level cell NAND flash memory programming, which was published in the industrial session of HPCA 2017, and examines the work's…

Energy efficiency is one of the most critical design criteria for modern embedded systems such as multiprocessor system-on-chips (MPSoCs). Dynamic voltage and frequency scaling (DVFS) and dynamic power management (DPM) are two major…

In sub-10nm FinFETs, Line-edge-roughness (LER) and metal-gate granularity (MGG) are the two most dominant sources of variability and are mostly modeled semi-empirically. In this work, compact models of LER and MGG are used. We show an…

Computing-in-Memory (CiM) architectures aim to reduce costly data transfers by performing arithmetic and logic operations in memory and hence relieve the pressure due to the memory wall. However, determining whether a given workload can…

Graphics processing units (GPUs) are gaining widespread use in computational chemistry and other scientific simulation contexts because of their huge performance advantages relative to conventional CPUs. However, the reliability of GPUs in…

Efficient utilization of today's high-performance computing (HPC) systems with complex hardware and software components requires that the HPC applications are designed to tolerate process failures at runtime. With low mean time to failure…

Accurate on-chip temperature sensing is critical for the optimal performance of modern CMOS integrated circuits (ICs), to understand and monitor localized heating around the chip during operation. The development of quantum computers has…

Memcomputing is a novel computing paradigm beyond the von-Neumann one. Its digital version is designed for the efficient solution of combinatorial optimization problems, which emerge in various fields of science and technology. Previously,…

Scalable nonvolatile memory DIMMs will finally be commercially available with the release of the Intel Optane DC Persistent Memory Module (or just "Optane DC PMM"). This new nonvolatile DIMM supports byte-granularity accesses with access…

Software testing is becoming a critical part of the development cycle of embedded devices, enabling vulnerability detection. A well-studied approach of software testing is fuzz-testing (fuzzing), during which mutated input is sent to an…

The rise of transient faults in modern hardware requires system designers to consider errors occurring at runtime. Both hardware- and software-based error handling must be deployed to meet application reliability requirements. The level of…

In this paper, we exploit the aggressive supply voltage underscaling technique in Block RAMs (BRAMs) of Field Programmable Gate Arrays (FPGAs) to improve the energy efficiency of Multi-Layer Perceptrons (MLPs). Additionally, we evaluate and…