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The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

应用物理 · 物理学 2024-06-19 Omur E Dagdeviren

We explore how the existence of a field with a heavy mass influences the low energy dynamics of a quantum field with a light mass by expounding the stochastic characters of their interactions which take on the form of fluctuations in the…

高能物理 - 理论 · 物理学 2008-11-26 E. Calzetta , B-L. Hu

We explore the impact of geometrical corrugations on the near-wall flow properties of a soft-material driven in a confined rough microchannel. By means of numerical simulations, we perform a quantitative analysis of the relation between the…

软凝聚态物质 · 物理学 2020-06-22 F. Pelusi , M. Sbragaglia , A. Scagliarini , M. Lulli , M. Bernaschi , S. Succi

The ability to control wettability is important for a wide range of technological applications in which precise microfluidic handling is required. It is known that predesigned roughness at a micro- or nano- scale enhances the wetting…

软凝聚态物质 · 物理学 2013-04-09 Michail E. Kavousanakis , Carlos E. Colosqui , Athanasios G. Papathanasiou

Based on the physics of stochastic processes we present a new approach for structural health monitoring. We show that the new method allows for an in-situ analysis of the elastic features of a mechanical structure even for realistic…

数据分析、统计与概率 · 物理学 2013-01-08 Philip Rinn , Hendrik Heißelmann , Matthias Wächter , Joachim Peinke

In conventional optical Stark-shift spectroscopy, molecules are exposed to spatially homogeneous static electric fields that shift the energies of their spectral lines. These shifts are attributed to the molecular electronic properties,…

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

软凝聚态物质 · 物理学 2007-05-23 Davood Norouzi , Martin Michael Mueller , Markus Deserno

In this article we recover the distribution function (and possible density) of an arbitrary random variable that is subject to an additive measurement error. This problem is also known as deconvolution and has a long tradition in…

统计理论 · 数学 2025-10-07 Henrik Kaiser

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments are based on…

应用物理 · 物理学 2018-12-24 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Tyler Enright , Peter Grütter

Previous and present "academic" research aiming at atomic scale understanding is mainly concerned with the study of individual molecular processes possibly underlying materials science applications. Appealing properties of an individual…

材料科学 · 物理学 2015-06-24 Karsten Reuter , Catherine Stampfl , Matthias Scheffler

The velocity field and the height at the surface of a dynamic ice sheet are observed. The ice sheets are modeled by the full Stokes equations and shallow shelf/shelfy stream approximations. Time dependence is introduced by a kinematic free…

计算物理 · 物理学 2020-01-27 Gong Cheng , Per Lötstedt

The friction coefficient and the base topography of a stationary and a dynamic ice sheet are perturbed in two models for the ice: the full Stokes equations and the shallow shelf approximation. The sensitivity to the perturbations of the…

计算物理 · 物理学 2019-06-21 Gong Cheng , Per Lötstedt

Systematic displacement measurements of freestanding graphene as a function of applied bias voltage and tunneling current setpoint using scanning tunneling microscopy (STM) are presented. When the bias voltage is increased the graphene…

介观与纳米尺度物理 · 物理学 2015-01-23 P. Xu , S. D. Barber , M. L. Ackerman , J. K. Schoelz , P. M. Thibado

Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…

应用物理 · 物理学 2025-06-18 Kenichi Umeda , Karen Kamoshita , Noriyuki Kodera

The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…

介观与纳米尺度物理 · 物理学 2019-04-16 Liam Collins , Yongtao Liu , Olga Ovchinnikova , Roger Proksch

An interesting aspect in the research of complex (dusty) plasmas is the experimental study of the interaction of micro-particles with the surrounding plasma for diagnostic purposes. Local electric fields can be determined from the behaviour…

等离子体物理 · 物理学 2009-11-13 R. Basner , F. Sigeneger , D. Loffhagen , G. Schubert , H. Fehske , H. Kersten

We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample properties, such as surface resistance and dielectric…

材料科学 · 物理学 2009-10-30 D. E. Steinhauer , C. P. Vlahacos , S. K. Dutta , F. C. Wellstood , Steven M. Anlage

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

介观与纳米尺度物理 · 物理学 2017-02-01 Nina Balke , Stephen Jesse , Ben Carmichael , M. Baris Okatan , Ivan I. Kravchenko , Sergei V. Kalinin , Alexander Tselev

Surface roughness is an important quantity to many engineering and precision manufacturing disciplines. In this paper we investigate the problem of estimating the root-mean-square roughness of a sample by passive linear optical methods. By…

Constriction-based Josephson weak-links display a thermal bi-stability between two states exhibiting zero and finite voltages. This manifests in experiments either as hysteresis in weak-links current voltage characteristics or as random…