理解 SiPM 对带电粒子的直接探测
仪器与探测器
2022-10-25 v1 高能物理 - 实验
摘要
本文报道了证据：SiPM 传感器对穿过带电粒子的响应增强主要与其保护层中产生的切伦科夫光有关。我们研究了具有不同保护层的传感器的响应与计时特性。
引用
@article{arxiv.2210.13244,
title = {Understanding the direct detection of charged particles with SiPMs},
author = {F. Carnesecchi and G. Vignola and N. Agrawal and A. Alici and P. Antonioli and S. Arcelli and F. Bellini and D. Cavazza and L. Cifarelli and M. Colocci and S. Durando and F. Ercolessi and A. Ficorella and C. Fraticelli and M. Garbini and M. Giacalone and A. Gola and D. Hatzifotiadou and N. Jacazio and A. Margotti and G. Malfattore and R. Nania and F. Noferini and G. Paternoster and O. Pinazza and R. Preghenella and R. Rath and R. Ricci and L. Rignanese and N. Rubini and B. Sabiu and E. Scapparone and G. Scioli and S. Strazzi and S. Tripathy and A. Zichichi},
journal= {arXiv preprint arXiv:2210.13244},
year = {2022}
}