Probe-configuration dependent dephasing in a mesoscopic interferometer
介观与纳米尺度物理
2009-11-10 v1
摘要
Dephasing in a ballistic four-terminal Aharonov-Bohm geometry due to charge and voltage fluctuations is investigated. Treating two terminals as voltage probes, we find a strong dependence of the dephasing rate on the probe configuration in agreement with a recent experiment by Kobayashi et al. (J. Phys. Soc. Jpn. 71, 2094 (2002)). Voltage fluctuations in the measurement circuit are shown to be the source of the configuration dependence.
引用
@article{arxiv.cond-mat/0304022,
title = {Probe-configuration dependent dephasing in a mesoscopic interferometer},
author = {G. Seelig and S. Pilgram and A. N. Jordan and M. Buttiker},
journal= {arXiv preprint arXiv:cond-mat/0304022},
year = {2009}
}
备注
4 pages, 3 figures