New electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range
摘要
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical results and state-of-the-art numerical simulations show that it is possible to create 100 keV, 0.1 pC, 20 fs electron bunches with a spotsize smaller than 500 micron and a transverse coherence length of 3 nm, using established technologies in a table-top set-up. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by established radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing an entirely new ultrafast electron diffraction source concept.
引用
@article{arxiv.physics/0702018,
title = {New electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range},
author = {T. van Oudheusden and E. F. de Jong and B. J. Siwick and S. B. van der Geer and W. P. E. M. Op 't Root and O. J. Luiten},
journal= {arXiv preprint arXiv:physics/0702018},
year = {2009}
}