A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques
摘要
In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub-millimeter bunch length can be measured.
引用
@article{arxiv.physics/0110052,
title = {A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques},
author = {Y. K. Semertzidis and R. Burns and V. Castillo and R. Larsen and D. M. Lazarus and D. Nikas and C. Ozben and T. Srinivasan-Rao and A. Stillman and T. Tsang and L. Kowalski},
journal= {arXiv preprint arXiv:physics/0110052},
year = {2016}
}
备注
3 pages, 1 figure. The paper was presented as contribution to working group T9 at Snowmass2001