中文

利用半轻子标记法测量$\mathcal{R}(D)$与$\mathcal{R}(D^{\ast})$

高能物理 - 实验 2019-04-30 v2

摘要

我们报告了分支比比值R(D)=B(BˉDτνˉτ)/B(BˉDνˉ)\mathcal{R}(D) = {\cal B}(\bar{B} \to D \tau^- \bar{\nu}_{\tau})/{\cal B}(\bar{B} \to D \ell^- \bar{\nu}_{\ell})R(D)=B(BˉDτνˉτ)/B(BˉDνˉ)\mathcal{R}(D^{\ast}) = {\cal B}(\bar{B} \to D^* \tau^- \bar{\nu}_{\tau})/{\cal B}(\bar{B} \to D^* \ell^- \bar{\nu}_{\ell})的测量结果,其中\ell表示电子或缪子。结果基于含有772×106772\times10^6BBˉB\bar{B}事件的数据样本,该样本在KEKB e+ee^+ e^-对撞机上由Belle探测器于Υ(4S)\Upsilon(4S)共振态处记录。分析采用一种方法,其中标记侧BB介子以半轻子衰变模式重建,而信号侧τ\tau以纯轻子衰变重建。测量值为R(D)=0.307±0.037±0.016\mathcal{R}(D)= 0.307 \pm 0.037 \pm 0.016R(D)=0.283±0.018±0.014\mathcal{R}(D^{\ast})= 0.283 \pm 0.018 \pm 0.014,其中第一项不确定度为统计不确定度,第二项为系统不确定度。这些结果分别与标准模型预测在0.20.21.11.1标准偏差内一致,而它们的组合与标准模型预测在1.21.2标准偏差内一致。

关键词

引用

@article{arxiv.1904.08794,
  title  = {Measurement of $\mathcal{R}(D)$ and $\mathcal{R}(D^{\ast})$ with a semileptonic tagging method},
  author = {The Belle Collaboration and A. Abdesselam and I. Adachi and K. Adamczyk and H. Aihara and S. Al Said and K. Arinstein and Y. Arita and D. M. Asner and T. Aso and H. Atmacan and V. Aulchenko and T. Aushev and R. Ayad and T. Aziz and V. Babu and I. Badhrees and S. Bahinipati and A. M. Bakich and A. Bala and Y. Ban and V. Bansal and E. Barberio and M. Barrett and W. Bartel and A. Bay and P. Behera and M. Belhorn and K. Belous and M. Berger and F. U. Bernlochner and D. Besson and V. Bhardwaj and B. Bhuyan and J. Biswal and T. Bloomfield and S. Blyth and A. Bobrov and A. Bondar and G. Bonvicini and C. Bookwalter and C. Boulahouache and A. Bozek and M. Bračko and N. Braun and F. Breibeck and J. Brodzicka and T. E. Browder and G. Caria and D. Červenkov and M. -C. Chang and P. Chang and Y. Chao and V. Chekelian and A. Chen and K. -F. Chen and P. Chen and B. G. Cheon and K. Chilikin and R. Chistov and K. Cho and V. Chobanova and S. -K. Choi and Y. Choi and D. Cinabro and J. 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Hsu and M. Huschle and H. J. Hyun and Y. Igarashi and T. Iijima and M. Imamura and K. Inami and G. Inguglia and A. Ishikawa and K. Itagaki and R. Itoh and M. Iwabuchi and M. Iwasaki and Y. Iwasaki and S. Iwata and W. W. Jacobs and I. Jaegle and H. B. Jeon and S. Jia and Y. Jin and D. Joffe and M. Jones and K. K. Joo and T. Julius and J. Kahn and H. Kakuno and A. B. Kaliyar and J. H. Kang and K. H. Kang and P. Kapusta and G. Karyan and S. U. Kataoka and E. Kato and Y. Kato and P. Katrenko and H. Kawai and T. Kawasaki and T. Keck and H. Kichimi and C. Kiesling and B. H. Kim and D. Y. Kim and H. J. Kim and H. -J. Kim and J. B. Kim and J. H. Kim and K. T. Kim and M. J. Kim and S. H. Kim and S. K. Kim and Y. J. Kim and K. Kinoshita and C. Kleinwort and J. Klucar and B. R. Ko and N. Kobayashi and S. Koblitz and P. Kodyš and Y. Koga and S. Korpar and D. Kotchetkov and R. T. Kouzes and P. Križan and P. Krokovny and B. Kronenbitter and T. Kuhr and R. Kulasiri and R. Kumar and T. Kumita and E. 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Sasaki and N. Sasao and Y. Sato and V. Savinov and T. Schlüter and O. Schneider and G. Schnell and P. Schönmeier and M. Schram and C. Schwanda and A. J. Schwartz and B. Schwenker and R. Seidl and Y. Seino and D. Semmler and K. Senyo and O. Seon and I. S. Seong and M. E. Sevior and L. Shang and M. Shapkin and V. Shebalin and C. P. Shen and T. -A. Shibata and H. Shibuya and N. Shimizu and S. Shinomiya and J. -G. Shiu and B. Shwartz and A. Sibidanov and F. Simon and J. B. Singh and R. Sinha and P. Smerkol and Y. -S. Sohn and A. Sokolov and Y. Soloviev and E. Solovieva and S. Stanič and M. Starič and M. Steder and J. F. Strube and J. Stypula and S. Sugihara and A. Sugiyama and M. Sumihama and K. Sumisawa and T. Sumiyoshi and K. Suzuki and K. Suzuki and S. Suzuki and S. Y. Suzuki and Z. Suzuki and H. Takeichi and M. Takizawa and U. Tamponi and M. Tanaka and S. Tanaka and K. Tanida and N. Taniguchi and G. N. Taylor and F. Tenchini and Y. Teramoto and I. Tikhomirov and K. Trabelsi and V. Trusov and T. Tsuboyama and M. Uchida and T. Uchida and S. Uehara and K. Ueno and T. Uglov and Y. Unno and S. Uno and S. Uozumi and P. Urquijo and Y. Ushiroda and Y. Usov and S. E. Vahsen and C. Van Hulse and P. Vanhoefer and G. Varner and K. E. Varvell and K. Vervink and A. Vinokurova and V. Vorobyev and A. Vossen and M. N. Wagner and E. Waheed and B. Wang and C. H. Wang and J. Wang and M. -Z. Wang and P. Wang and X. L. Wang and M. Watanabe and Y. Watanabe and R. Wedd and S. Wehle and E. White and E. Widmann and J. Wiechczynski and K. M. Williams and E. Won and B. D. Yabsley and S. Yamada and H. Yamamoto and J. Yamaoka and Y. Yamashita and M. Yamauchi and S. Yashchenko and H. Ye and J. Yelton and Y. Yook and C. Z. Yuan and Y. Yusa and C. C. Zhang and L. M. Zhang and Z. P. Zhang and L. Zhao and V. Zhilich and V. Zhukova and V. Zhulanov and M. Ziegler and T. Zivko and A. Zupanc and N. Zwahlen},
  journal= {arXiv preprint arXiv:1904.08794},
  year   = {2019}
}

备注

12 pages, 6 figures