Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films
摘要
Spin Polarized Low Energy Electron Microscopy is used as a spin dependent spectroscopic probe to study the spin dependent specular reflection of a polarized electron beam from two different magnetic thin film systems: Fe/W(110) and Co/W(110). The reflectivity and spin-dependent exchange-scattering asymmetry are studied as a function of electron kinetic energy and film thickness, as well as the time dependence. The largest value of the figure of merit for spin polarimetry is observed for a 5 monolayer thick film of Co/W(110) at an electron kinetic energy of 2eV. This value is 2 orders of magnitude higher than previously obtained with state of the art Mini-Mott polarimeter. We discuss implications of our results for the development of an electron-spin-polarimeter using the exchange-interaction at low energy.
引用
@article{arxiv.cond-mat/0404720,
title = {Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films},
author = {J. Graf and C. Jozwiak and A. K. Schmid and Z. Hussain and A. Lanzara},
journal= {arXiv preprint arXiv:cond-mat/0404720},
year = {2007}
}
备注
5 pages, 4 figures