Interlacing in atomic resolution scanning transmission electron microscopy
Instrumentation and Detectors
2023-08-09 v1
Abstract
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist for increasing frame-rates, many impact image quality or require investment in advanced scan hardware. Here we present an interlaced imaging approach to achieve minimal loss of image quality with faster frame-rates that can be implemented on many existing scan controllers. We further demonstrate that our interlacing approach provides the best possible strain precision for a given electron dose compared with other contemporary approaches.
Cite
@article{arxiv.2211.06954,
title = {Interlacing in atomic resolution scanning transmission electron microscopy},
author = {Jonathan J. P Peters and Tiarnan Mullarkey and James A. Gott and Elizabeth Nelson and Lewys Jones},
journal= {arXiv preprint arXiv:2211.06954},
year = {2023}
}