Materials Science · Physics
Quantitative approaches for multi-scale structural analysis with atomic resolution electron microscopy
Noah Schnitzer, Lopa Bhatt, Ismail El Baggari, Robert Hovden +3
2025-09-29
Materials Science · Physics
Towards Automating Structural Discovery in Scanning Transmission Electron Microscopy
Nicole Creange, Ondrej Dyck, Rama K. Vasudevan, Maxim Ziatdinov +1
2021-08-11
Instrumentation and Detectors · Physics
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) on Non-Rectangular Scans
Xin Li, Ondrej Dyck, Sergei V. Kalinin, Stephen Jesse
2019-01-15
Computer Vision and Pattern Recognition · Computer Science
Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy
Josh Kacher, Yao Xie, Sven P. Voigt, Shixiang Zhu +3
2021-08-24
Signal Processing · Electrical Eng. & Systems
Compressive Scanning Transmission Electron Microscopy
Daniel Nicholls, Alex Robinson, Jack Wells, Amirafshar Moshtaghpour +3
2021-12-23
Instrumentation and Detectors · Physics
Multi-pass transmission electron microscopy
Thomas Juffmann, Stewart A. Koppell, Brannon B. Klopfer, Colin Ophus +2
2016-12-16
Machine Learning · Computer Science
A Mixture of Experts Foundation Model for Scanning Electron Microscopy Image Analysis
Sk Miraj Ahmed, Yuewei Lin, Chuntian Cao, Shinjae Yoo +8
2026-04-08
Materials Science · Physics
Data-Driven Electron Microscopy: Electron Diffraction Imaging of Materials Structural Properties
Jian-Min Zuo, Renliang Yuan, Yu-Tsun Shao, Haw-Wen Hsiao +4
2021-10-06
Materials Science · Physics
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
Maxim Ziatdinov, Ondrej Dyck, Artem Maksov, Xufan Li +6
2018-01-19
Materials Science · Physics
Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy
Stephen J. Pennycook, Changjian Li, Mengsha Li, Chunhua Tang +4
2019-08-21
Materials Science · Physics
Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling
Marc Botifoll, Ivan Pinto-Huguet, Enzo Rotunno, Thomas Galvani +16
2025-10-28
Materials Science · Physics
An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics
Matthew Olszta, Derek Hopkins, Kevin R. Fiedler, Marjolein Oostrom +2
2022-06-23
Image and Video Processing · Electrical Eng. & Systems
Machine Learning Pipeline for Segmentation and Defect Identification from High Resolution Transmission Electron Microscopy Data
C. K. Groschner, Christina Choi, M. C. Scott
2021-07-07
Instrumentation and Detectors · Physics
Isotope analysis in the transmission electron microscope
Toma Susi, Christoph Hofer, Giacomo Argentero, Gregor T. Leuthner +4
2016-11-03
Instrumentation and Detectors · Physics
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott, Elizabeth Nelson +1
2023-08-09
Mesoscale and Nanoscale Physics · Physics
Learning and Controlling Silicon Dopant Transitions in Graphene using Scanning Transmission Electron Microscopy
Max Schwarzer, Jesse Farebrother, Joshua Greaves, Ekin Dogus Cubuk +7
2023-11-30
Materials Science · Physics
Identification and Correction of Temporal and Spatial Distortions in Scanning Transmission Electron Microscopy
Kevin M. Roccapriore, Nicole Creange, Maxim Ziatdinov, Sergei V. Kalinin
2021-10-05
Materials Science · Physics
Automated experiment in 4D-STEM: exploring emergent physics and structural behaviors
Kevin M. Roccapriore, Ondrej Dyck, Mark P. Oxley, Maxim Ziatdinov +1
2022-04-22
Materials Science · Physics
Automatic Identification of Crystal Structures and Interfaces via Artificial-Intelligence-based Electron Microscopy
Andreas Leitherer, Byung Chul Yeo, Christian H. Liebscher, Luca M. Ghiringhelli
2023-09-07
Disordered Systems and Neural Networks · Physics
Probing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy
Kevin M. Roccapriore, Matthew G. Boebinger, Ondrej Dyck, Ayana Ghosh +3
2022-07-27
Applied Physics · Physics
Demonstration of an AI-driven workflow for autonomous high-resolution scanning microscopy
Saugat Kandel, Tao Zhou, Anakha V Babu, Zichao Di +6
2023-01-16