Related papers: Interlacing in atomic resolution scanning transmis…
Progressive acquisition of slowly-scanned images is desirable for drift correction and real-time visualization. Interlacing methods are common approaches to storing and transmitting data on rectilinear grids, and here we propose using them…
Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…
From biology and astronomy to quantum optics, there is a critical need for high frame rate, high quantum efficiency imaging. In practice, most cameras only satisfy one of these requirements. Here we introduce interlaced fast kinetics…
We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…
Hyperspectral imaging aims at providing information on both the spatial and the spectral distribution of light, with high resolution. However, state-of-the-art protocols are characterized by an intrinsic trade-off imposing to sacrifice…
Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…
Atomic-scale imaging offers a reliable tool to directly measure the movement of microscopic particles. We present a scheme for achieving a nondestructive and ultrasensitive imaging of Rydberg atoms within an ensemble of cold probe atoms.…
A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
The key to optimizing spatial resolution in a state-of-the-art scanning transmission electron microscope is the ability to precisely measure and correct for electron optical aberrations of the probe-forming lenses. Several diagnostic…
High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt…
Electron capture processes are important in the search for new physics. In this context, a high capture rate is desired. We investigate the possibility of enhancing the electron capture rate by irradiating laser beam to ''atom''. The…
Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of…
Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The…
We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is…
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…
We demonstrate a high data-rate light-pulse atom interferometer for measuring acceleration. The device is optimized to operate at rates between 50 Hz to 330 Hz with sensitivities of 0.57 {\mu}g/rtHz to 36.7 {\mu}g/rtHz, respectively. Our…