Related papers: Interlacing in atomic resolution scanning transmis…
The uniformity of the intensity and phase of laser beams is crucial to high-performance atom interferometers. Inhomogeneities in the laser intensity profile cause contrast reductions and systematic effects in interferometers operated with…
Collinear laser spectroscopy of fast atomic beams has been established as one of the main tools to perform precision experiments with atoms containing short-lived nuclei. Although highly sensitive, the spectral resolution of these…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
Photonic interconnects are a key technology for scaling up atomic based quantum computers. By facilitating the connection of multiple systems, high-performance modular quantum processing units may be constructed to perform deeper and more…
Digital medical images are always displayed scaled to fit particular view. Interpolation is responsible for this scaling, and if not done properly, can significantly degrade diagnostic image quality. However, theoretically-optimal…
In scanning electron microscopy, the achievable image quality is often limited by a maximum feasible acquisition time per dataset. Particularly with regard to three-dimensional or large field-of-view imaging, a compromise must be found…
This paper is concerned with investigating super-resolution algorithms and solutions for handling electron microscopic images. We note two main aspects differentiating the problem discussed here from those considered in the literature. The…
The extraordinary improvements of modern imaging devices offer access to data with unprecedented information content. However, widely used image processing methodologies fall far short of exploiting the full breadth of information offered…
Important recent advances in transmission electron microscopy instrumentation and capabilities have made it indispensable for atomic-scale materials characterization. At the same time, the availability of two-dimensional materials has…
Dual-energy computed tomography (DECT) has been widely used to obtain quantitative elemental composition of imaged subjects for personalized and precise medical diagnosis. Compared with existing high-end DECT leveraging advanced X-ray…
The discovery and understanding of many ultrafast dynamical processes are often invaluable. This paper is the first report to apply optical parametric amplification to implement single-shot ultrafast imaging with high space and time…
The propagation of light in moving media is dragged by atomic motion. The light-drag effect can be dramatically enhanced by reducing the group velocity with electro-magnetically induced transparency (EIT). We develop a systematic procedure…
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…
Several Scientific and engineering applications require merging of sampled images for complex perception development. In most cases, for such requirements, images are merged at intensity level. Even though it gives fairly good perception of…
Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…
It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…
Simulation of atomic resolution image formation in scanning transmission electron microscopy can require significant computation times using traditional methods. A recently developed method, termed plane-wave reciprocal-space interpolated…
We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…