中文

High-order mid-infrared nonlinear topological differentiator

光学 2026-05-14 v1

摘要

High-order edge-enhanced imaging enables precise feature localization and effective background suppression, offering a powerful tool for real-time recognition and high-contrast visualization. Extending this capability to the mid-infrared (MIR) regime is particularly valuable for applications such as biomedical diagnostics, material inspection, and remote sensing, yet remains limited by inadequate spatial-frequency modulation fidelity and low detection sensitivity. Here, we demonstrate a high-sensitivity MIR upconversion differentiator operating at 3 μ\mum, which achieves isotropic high-order edge enhancement by optically imprinting topological complex-amplitude patterns onto MIR Fourier components via nonlinear parametric interaction. Vortex transfer functions t(kr,ϕ)kreiϕt(k_r, \phi) \propto k_r^\ell e^{i\ell\phi} are precisely encoded on a phase-only spatial light modulator to enable tunable MIR differentiation from first- to fourth- order, with real-time switching at up to 60 Hz. Benefiting from a low-noise upconversion process and a single-photon-sensitive silicon camera, the system achieves high-contrast edge imaging under low-light conditions. Experimental results confirm accurate edge extraction and background suppression for both amplitude and phase objects, hence underscoring its potential for noninvasive diagnostics and label-free material analysis.

关键词

引用

@article{arxiv.2605.13541,
  title  = {High-order mid-infrared nonlinear topological differentiator},
  author = {Jixi Zhang and Kun Huang and Shina Liao and Zhuohang Wei and Jianan Fang and Heping Zeng},
  journal= {arXiv preprint arXiv:2605.13541},
  year   = {2026}
}