Full-field hard x-ray microscopy with interdigitated silicon lenses
Abstract
Full-field x-ray microscopy using x-ray objectives has become a mainstay of the biological and materials sciences. However, the inefficiency of existing objectives at x-ray energies above 15 keV has limited the technique to weakly absorbing or two-dimensional (2D) samples. Here, we show that significant gains in numerical aperture and spatial resolution may be possible at hard x-ray energies by using silicon-based optics comprising 'interdigitated' refractive silicon lenslets that alternate their focus between the horizontal and vertical directions. By capitalizing on the nano-manufacturing processes available to silicon, we show that it is possible to overcome the inherent inefficiencies of silicon-based optics and interdigitated geometries. As a proof-of-concept of Si-based interdigitated objectives, we demonstrate a prototype interdigitated lens with a resolution of ~255 nm at 17 keV.
Cite
@article{arxiv.1506.06677,
title = {Full-field hard x-ray microscopy with interdigitated silicon lenses},
author = {Hugh Simons and Frederik Stöhr and Jonas Michael-Lindhard and Flemming Jensen and Ole Hansen and Carsten Detlefs and Henning Friis Poulsen},
journal= {arXiv preprint arXiv:1506.06677},
year = {2015}
}
Comments
10 pages, 5 figure. Submitted to Applied Physics Letters 31st March 2015, rejected 17th June 2015