Focal shift of silicon microlens in mid-infrared regime
Optics
2016-04-20 v1
Abstract
In this study, rigorous numerical calculation was utilized to characterize the focal properties of mid-infrared silicon microlens with the size about tens of micrometers. It is found that the focal shift phenomenon also exists in mid-infrared regime, which behaves differently from that of visual and near-infrared wavelength. Focal properties of silicon microlens were also measured experimentally, showing well coherence with simulation results. Our results provide systemic understanding of focal shift in mid-infrared regime, at that wavelength special consideration should be paid in micro-nano optics, especially with the integration between infrared optical system and other devices.
Keywords
Cite
@article{arxiv.1604.02521,
title = {Focal shift of silicon microlens in mid-infrared regime},
author = {Haijie Zuo and Jiangyong Zhang and Leiying Ying and Baoping Zhang and Zhijin Hou and Hongxu Chen and Junjie Si},
journal= {arXiv preprint arXiv:1604.02521},
year = {2016}
}
Comments
11 pages, 4 figures, research article