Total internal reflection based super-resolution imaging for sub-IR frequencies
Abstract
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables both sub-wavelength lateral resolution and optical thickness sensitivity. We illuminate a sample in a total internal reflection geometry, with a photo-activated spatial modulator in the near-field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues.
Cite
@article{arxiv.2006.02091,
title = {Total internal reflection based super-resolution imaging for sub-IR frequencies},
author = {Lauren E. Barr and Peter Karlsen and Samuel M. Hornett and Ian R. Hooper and Michal Mrnka and Christopher R. Lawrence and David B. Phillips and Euan Hendry},
journal= {arXiv preprint arXiv:2006.02091},
year = {2020}
}
Comments
Main text has 13 pages & 4 figures