Efficient and Robust p-type Transistor based on Ultra-wide-bandgap Semiconductor
Abstract
The p-type transistor is an indispensable component of semiconductor technology, enabling complementary operation with n-channel transistors for computation, storage, and communication. Achieving both high robustness and high efficiency is highly desirable but challenging for p-type transistors due to limited semiconductors with reliable hole transport and their high activation energies. Here, we achieved a robust yet efficient p-type transistor by heterogeneously integrating an ultra-wide-bandgap semiconductor and a high-k dielectric layer through van der Waals integration. The p-type transistor employs a two-dimensional hole channel on hydrogenated diamond (bandgap 5.6 eV) combined with a high-k (30.5) SrTiO3 perovskite membrane. At room temperature, the transistor exhibits stable operation with a high on-current (~200 mA/mm), low subthreshold swing (70 mV/dec), high hole mobility (566 cm^2/Vs to 572 cm^2/Vs) and high on-off ratio (~10^9). Furthermore, tuning annealing temperature allows operation in either enhancement or depletion mode. The robust p-type transistor with high efficiency holds great potential for future power electronics, UV optoelectronics, and harsh-environment electronic applications.
Keywords
Cite
@article{arxiv.2602.07424,
title = {Efficient and Robust p-type Transistor based on Ultra-wide-bandgap Semiconductor},
author = {Kaijian Xing and Zherui Yang and Weiyao Zhao and Yuefeng Yin and Huiping Han and Shanhu Wang and Shifan Wang and James Bullock and Alastair Stacey and James A. Belcourt and Sergey Rubanov and Hang Yin and David A. Broadway and Jean-Philippe Tetienne and Xinmao Yin and Liang Wu and Dong-Chen Qi and Michael S. Fuhrer and Qingdong Ou and Xiao Renshaw Wang},
journal= {arXiv preprint arXiv:2602.07424},
year = {2026}
}
Comments
21 pages, 5 figures