波导晶格中二阶耦合的直接测量
光学
2015-12-16 v2
摘要
我们通过集成本征模干涉仪直接测量了耦合光学波导阵列中的次近邻耦合。与光传播实验不同，该技术对最近邻动力学不敏感。我们的结果表明，线性构型中的二阶耦合可被抑制到远低于导模指数衰减所预期的水平。
引用
@article{arxiv.1510.07900,
title = {Direct measurement of second-order coupling in a waveguide lattice},
author = {Robert Keil and Benedikt Pressl and René Heilmann and Markus Gräfe and Gregor Weihs and Alexander Szameit},
journal= {arXiv preprint arXiv:1510.07900},
year = {2015}
}
备注
Accepted by Applied Physics Letters. After publication, it will be found at http://scitation.aip.org/content/aip/journal/apl