最小超引力中由 $b \to s \gamma$ 过程给出的带电 Higgs 质量界限
高能物理 - 唯象学
2009-10-28 v1
摘要
在最小超引力的框架下，研究了近期对包含 衰变的测量对带电 Higgs 玻色子质量的约束。结果表明，带电 Higgs 质量的下限关键取决于 Higgsino 质量参数（）的符号。当 且两个 Higgs 真空期望值之比（）大于 10 时，该下限超过 400 GeV。对于 的情况，由于带电 Higgs 与超对称粒子贡献之间的抵消，未得到强约束。
引用
@article{arxiv.hep-ph/9601368,
title = {Charged Higgs mass bound from the $b \to s \gamma$ process in the minimal supergravity},
author = {Toru Goto and Yasuhiro Okada},
journal= {arXiv preprint arXiv:hep-ph/9601368},
year = {2009}
}
备注
Talk given by Toru Goto at Yukawa International Seminar '95: From the Standard Model to Grand Unified Theories, Kyoto, Japan, 21-25 Aug 1995; 10 pages LaTeX with ptptex.sty; 5 figures are included with epsf.sty